Capabilities of through-the-substrate microdiffraction: application of Patterson-function direct methods to synchrotron data from polished thin sections

Rius, Jordi; Labrador, Ana; Crespi, Anna; Frontera, C.; Vallcorba, Oriol; Melgarejo, Joan Carles

doi:10.1107/s0909049511038830

Cited by 13 publications

(9 citation statements)

References 13 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Synchrotron through‐the‐substrate X‐ray microdiffraction (tts‐μXRD) was used for the structural characterisation of crystalline mineral phases in situ , within standard polished thin sections (Rius et al., , ). PGM‐bearing monolayer polished sections were first transformed to polished thin sections, 30 μm thick, attached to an approximately <1 mm thick glass substrate.…”

Section: Sample Materials and Methodsmentioning

confidence: 99%

The supergene origin of ruthenian hexaferrum in Ni‐laterites

et al. 2017

Self Cite

View full text Add to dashboard Cite

For two decades, the nature of Fe-rich, oxygen-bearing, Ru-Os compounds found in the supergene environment has been debated. Ru-Os-Fe-oxides and nano-intergrowths of ruthenium with magnetite have been proposed. We applied FE-SEM, EMPA, l-Raman spectroscopy and synchrotron tts-lXRD to Ru-Os-Fe compounds recovered from Ni-laterites from the Dominican Republic. The results demonstrate that a significant portion of Fe exists in a common structure with the Ru-Os alloy, that is, ruthenian hexaferrum. This mineral occurs both as nanoparticles and as micrometric patches within a matrix of Fe-oxide(s). Our data suggest that supergene ruthenian hexaferrum with a (Ru 0.4 (Os,Ir) 0.1 Fe 0.5 ) Ʃ1.0 stoichiometry represents the most advanced weathering product of primary laurite within Ni-laterites from the Dominican Republic.

show abstract

Section: Sample Materials and Methodsmentioning

confidence: 99%

The supergene origin of ruthenian hexaferrum in Ni‐laterites

et al. 2017

Self Cite

View full text Add to dashboard Cite

show abstract

“…The sample-detector distance (180-250 mm) and the beam centre positions were calibrated from LaB 6 diffraction data measured at exactly the same conditions as the sample. The tts-μXRD allows collection of data directly on the thin sections preserving the textural context and allowing local mineral phase identification and/or structure determination [15,[26][27][28]. Mineralogical composition was retrieved for the analysed areas using Sleve+ plugin within PDF4+ database (ICDD).…”

Section: Methodsmentioning

confidence: 99%

Synchrotron tts-µXRD identification of secondary phases in ancient ceramics

et al. 2018

Self Cite

View full text Add to dashboard Cite

The study of the alteration process, and in particular of secondary phases precipitated in pottery after its production, can constrain the post-depositional environments or the type of use of the pottery. Detailed study of secondary phases can be done using different approaches, based on microscopic, microstructural and microchemical analyses, as well as mineralogical methods. In the present study are reported the results of the application of punctual mineralogical analysis by synchrotron through-the-substrate microdiffraction (tts-μXRD) to analyse secondary phases precipitated in ancient pottery (Bronze Age pottery form Frattesina in Italy and Mesolithic pottery form Al Khiday in Sudan). Although the chemical composition of these secondary phases in many cases almost matches with the stoichiometric composition of a known mineral, only some of them were actually true mineral phases (i.e. with crystallinity and therefore showing diffraction peaks), while others were amorphous. Some phases, the occurrence of which was previously attested only on the basis of their chemical composition (determined by scanning electron microscope or the electron microprobe analysis), were univocally identified as true vivianite (Fe 3 (PO 4) 2 •8H 2 O) and crandallite (CaAl 3 (PO 4) 2 (OH) 5 •H 2 O) minerals. Part of the phases detected in studied pottery, the chemical composition of which was consistent with specific mineral phases, were instead amorphous. The synchrotron through-the-substrate microdiffraction (tts-μXRD), therefore, represents a valid method for properly determine the mineralogical nature of secondary phases in pottery, as well as other small-sized and rare mineral phases occurring in polycrystalline materials of archaeological interest, such as pottery, mortars, painting and glassy materials.

show abstract

“…Reflection µXRD can be used for the identification of crystallites in glazes [115], but the transmission mode is definitely better. To specify that the measurement in the transmission mode is performed through a substrate supporting the specimen (e.g., a thin section on a glass-substrate), the prefix tts (through-the-substrate) was introduced [116]. Synchrotron tts-µXRD has been successfully tested on thin glaze sections.…”

Section: Tts-µxrd Applied To Petrographic Thin Sectionsmentioning

confidence: 99%

Breaking Preconceptions: Thin Section Petrography For Ceramic Glaze Microstructures

et al. 2019

Self Cite

View full text Add to dashboard Cite

During the last thirty years, microstructural and technological studies on ceramic glazes have been essentially carried out through the use of Scanning Electron Microscopy (SEM) combined with energy dispersive X-ray analysis (EDX). On the contrary, optical microscopy (OM) has been considered of limited use in solving the very complex and fine-scale microstructures associated with ceramic glazes. As the crystallites formed inside glazes are sub- and micrometric, a common misconception is that it is not possible to study them by OM. This is probably one of the reasons why there are no available articles and textbooks and even no visual resources for describing and characterizing the micro-crystallites formed in glaze matrices. A thin section petrography (TSP) for ceramic glaze microstructures does not exist yet, neither as a field of study nor conceptually. In the present contribution, we intend to show new developments in the field of ceramic glaze petrography, highlighting the potential of OM in the microstructural studies of ceramic glazes using petrographic thin sections. The outcomes not only stress the pivotal role of thin section petrography for the study of glaze microstructures but also show that this step should not be bypassed to achieve reliable readings of the glaze microstructures and sound interpretations of the technological procedures. We suggest the adoption by the scientific community of an alternative vision on glaze microstructures to turn thin section petrography for glaze microstructures into a new specialized petrographic discipline. Such an approach, if intensively developed, has the potential to reduce the time and costs of scientific investigations in this specific domain. In fact, it can provide key reference data for the identification of the crystallites in ceramic glazes, avoiding the repetition of exhaustive protocols of expensive integrated analyses.

show abstract

Capabilities of through-the-substrate microdiffraction: application of Patterson-function direct methods to synchrotron data from polished thin sections

Cited by 13 publications

References 13 publications

The supergene origin of ruthenian hexaferrum in Ni‐laterites

The supergene origin of ruthenian hexaferrum in Ni‐laterites

Synchrotron tts-µXRD identification of secondary phases in ancient ceramics

Breaking Preconceptions: Thin Section Petrography For Ceramic Glaze Microstructures

Contact Info

Product

Resources

About