Cantilever temperature characterization in low temperature vacuum atomic force microscope

Казанцев, Д. В.; Savio, Claudio Dal; Danzebrink, Hans‐Ulrich

doi:10.1063/1.2188417

Cited by 4 publications

(3 citation statements)

References 22 publications

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“…29 Although it might be possible to reconcile these various results by fitting parameters to a thermal hopping model as described in Refs. 34 Similar results are obtained when tips equipped with submicron thermocouples are brought into tunneling contact with a cold substrate. 19, or to the recent model of Barel et al 15 this type of analysis may not be meaningful because it is based on the assumption that the sliding asperity and the substrate are near thermal equilibrium and can be described by a single temperature.…”

Section: Discussionsupporting

confidence: 62%

“…The behavior of the temperature in the vicinity of the contact point is shown in Fig. 34 The heat current through the tip is approximately 10 W, but the current density is 10 9 W / m 2 , which is more than an order of magnitude higher than the heat flux in an arc welder. The only length scale in the problem is the contact radius R, so the temperature in both the conical tip and the substrate approaches their respective far field values at distances of order R. Table I shows the results of applying Eqs.…”

Section: Discussionmentioning

confidence: 98%

See 1 more Smart Citation

Temperature dependence of single-asperity friction for a diamond on diamondlike carbon interface

Dunckle

Altfeder

Voevodin

et al. 2010

Journal of Applied Physics

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Evolution of coefficient of friction with deposition temperature in diamond like carbon thin films J. Appl. Phys. 112, 023525 (2012); 10.1063/1.4740082Temperature dependent properties of silicon containing diamondlike carbon films prepared by plasma source ion implantation A variable temperature, ultrahigh vacuum atomic force microscope ͑AFM͒ was used to characterize interfacial friction for a single-asperity diamond contact on a diamondlike carbon ͑DLC͒ substrate over a nominal substrate temperature range of 90 to 275 K. Calibrated friction force measurements were obtained by analyzing lateral force hysteresis loops as a function of normal force. For sufficiently large normal forces, the lateral force was proportional to the normal force, and a friction coefficient could be identified. varied approximately linearly with substrate temperature, with = 0.28 at T = 90 K and = 0.38 at 275 K. These results are compared to other recent variable temperature AFM friction measurements and to theoretical calculations based on the Tomlinson model. This comparison is obscured by large, experimentally uncontrolled temperature differences between the tip and the substrate which inevitably exist in conventional, variable temperature AFMs. A thermal model which can be used to quantitatively estimate these temperature differences is presented.

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Section: Discussionsupporting

confidence: 62%

Section: Discussionmentioning

confidence: 98%

Temperature dependence of single-asperity friction for a diamond on diamondlike carbon interface

Dunckle

Altfeder

Voevodin

et al. 2010

Journal of Applied Physics

View full text Add to dashboard Cite

show abstract

“…The Young's modulus in turn affects the spring constant and resonant frequency of the cantilever. Kazantsev et al 20) observed a significant frequency shift in an AFM cantilever due to thermal coupling to the sample, with sample temperatures ranging from 15 to 399 K. The effect was ascribed to a change in the Young's modulus. Likewise Boyd et al found a 0.5% change in the Young's modulus and a decrease in resonant frequency with temperature over the range of 200 to 290 K. From Boyd et al we derived a linear temperature coefficient for the Young's modulus of −5.55 × 10 −5 (K −1 ).…”

Section: Effect Of Optical Absorption On Resonance Frequency Shiftmentioning

confidence: 99%

Control of quality factor of atomic force microscopy cantilever by cavity optomechanical effect

Austin-Bingamon,

D. C.,

Miyahara

2024

Jpn. J. Appl. Phys.

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The effective quality factor of the cantilever plays a fundamental role in dynamic mode atomic force microscopy. Here we present a technique to modify the quality factor of an atomic force microscopy cantilever within a Fabry-Perot optical interferometer. The experimental setup uses two separate laser sources to detect and excite the oscillation of the cantilever. While the intensity modulation of the excitation laser drives the oscillation of the cantilever, the average intensity can be used to modify the quality factor via optomechanical force without changing the fiber-cantilever cavity length. The technique enables users to optimize the quality factor for different types of measurements without influencing the deflection measurement sensitivity. An unexpected frequency shift was observed and modelled as temperature dependence of the cantilever's Young's modulus, which was validated using finite element simulation. The model was used to compensate for the thermal frequency shift. The simulation provided relations between optical power, temperature, and frequency shift.

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Temperature compensation in fluid density measurement using micro-electromechanical resonant sensor

Zhao

Huang

et al. 2018

Review of Scientific Instruments

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In order to improve the measuring accuracy of micro-electromechanical system (MEMS) resonant sensor with micro-cantilever structure to measure fluid density, a temperature compensation method is presented. The elastic modulus of the micro-cantilever is calculated considering its temperature coefficient so that the working equation to measure fluid density is obtained with decreasing temperature disturbance on the measuring accuracy. The simulations and experimental measurements of several fluids with different densities were carried out by the MEMS micro-cantilever resonant sensor under different temperatures. The simulation analyses showed that the fluid densities measured by using the proposed resonant density sensor with temperature compensation were more fitted with the reference density values than those without temperature compensation. The experimental results showed that both the measuring accuracy and stability of the MEMS micro-cantilever resonant sensor in fluid density measurement were increased more than twice based on the temperature compensation method. Therefore, the proposed temperature compensation method is important to improve the measuring precision and stability of the MEMS micro-cantilever resonant sensor in fluid density detection fields.

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Cantilever temperature characterization in low temperature vacuum atomic force microscope

Cited by 4 publications

References 22 publications

Temperature dependence of single-asperity friction for a diamond on diamondlike carbon interface

Temperature dependence of single-asperity friction for a diamond on diamondlike carbon interface

Control of quality factor of atomic force microscopy cantilever by cavity optomechanical effect

Temperature compensation in fluid density measurement using micro-electromechanical resonant sensor

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