2017 12th International Conference on Design &Amp; Technology of Integrated Systems in Nanoscale Era (DTIS) 2017
DOI: 10.1109/dtis.2017.7930177
|View full text |Cite
|
Sign up to set email alerts
|

Cantilever NEMS relay-based SRAM devices for enhanced reliability

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2019
2019
2019
2019

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(1 citation statement)
references
References 10 publications
0
1
0
Order By: Relevance
“…To decrease the pull-in voltage, NEMS process [23,24,28,29] or liquid dielectric [30,31] is necessary. As logic devices, the NEMS are perfect [32][33][34], but the NEMS devices are hard to be used as power devices to convert tens or even hundreds of milliamperes current [35][36][37]. Devices with liquid dielectric also have followed disadvantages: (a) they are realized by a complex process, (b) the liquid environment introduces large damping coefficient, which deteriorates the switching time of the relays.…”
Section: Introductionmentioning
confidence: 99%
“…To decrease the pull-in voltage, NEMS process [23,24,28,29] or liquid dielectric [30,31] is necessary. As logic devices, the NEMS are perfect [32][33][34], but the NEMS devices are hard to be used as power devices to convert tens or even hundreds of milliamperes current [35][36][37]. Devices with liquid dielectric also have followed disadvantages: (a) they are realized by a complex process, (b) the liquid environment introduces large damping coefficient, which deteriorates the switching time of the relays.…”
Section: Introductionmentioning
confidence: 99%