Calibration System for Zener Voltage Standards Using a 10 V Programmable Josephson Voltage Standard at NMIJ

Maruyama, Michitaka; Iwasa, Akio; Yamamori, Hirotake; Chen, Shih‐Fang; Urano, Chiharu; Kaneko, Nobu‐Hisa

doi:10.1109/tim.2015.2411998

Cited by 11 publications

(10 citation statements)

References 20 publications

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“…Since the first demonstration of stable quantum voltage Shapiro steps at non-zero current bias using externally shunted tunnel junctions, and then superconductor/normal metal/ superconductor (SNS) Josephson junctions (JJ) [1][2][3], the significant improvements in the junction materials and fabrication technology made by several national metrology institutes (NMIs) have enabled the output voltage of a single chip to achieve 10 V [4][5][6]. Following the successful implementation of programmable Josephson voltage standards (PJVS) at 10 V in recent years [7][8][9], quantum voltage reference systems based on a non-hysteretic JJ have progressively replaced conventional Josephson voltage standard (CJVS) systems based on metastable, zero-crossing quantum voltage steps as primary voltage standards at the institutes. Further improvement was accomplished by integrating PJVS devices successfully with liquid-free cryogenic mechanical coolers [10][11][12][13].…”

Section: Introductionmentioning

confidence: 99%

Direct DC 10 V comparison between two programmable Josephson voltage standards made of niobium nitride (NbN)-based and niobium (Nb)-based Josephson junctions

et al. 2018

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BIPM's new transportable programmable Josephson voltage standard (PJVS) has been used for an on-site comparison at the National Metrology Institute of Japan (NMIJ) and the National Institute of Advanced Industrial Science and Technology (AIST) (NMIJ/AIST, hereafter called just NMIJ unless otherwise noted). This is the first time that an array of niobium-based Josephson junctions with amorphous niobium silicon Nb x Si 1−x barriers, developed by the National Institute of Standards and Technology 4 (NIST), has been directly compared to an array of niobium nitride (NbN)-based junctions (developed by the NMIJ in collaboration with the Nanoelectronics Research Institute (NeRI), AIST). Nominally identical voltages produced by both systems agreed within 5 parts in 10 12 (0.05 nV at 10 V) with a combined relative uncertainty of 7.9 × 10 −11 (0.79 nV). The low side of the NMIJ apparatus is, by design, referred to the ground potential. An analysis of the systematic errors due to the leakage current to ground was conducted for this ground configuration. The influence of a multi-stage low-pass filter installed at the output measurement leads of the NMIJ primary standard was also investigated. The number of capacitances in parallel in the filter and their insulation resistance have a direct impact on the amplitude of the systematic voltage error introduced by the leakage current, even if the current does not necessarily return to ground. The filtering of the output of the PJVS voltage leads has the positive consequence of protecting the array from external sources of noise. Current noise, when coupled to the array, reduces the width or current range of the quantized voltage steps. The voltage error induced by the leakage current in the filter is an order of magnitude larger than the voltage error in the absence of all filtering, even though the current range of steps is significantly decreased without filtering. Bureau International des Poids et Mesures 4 Contribution of the US Government, not subject to copyright.

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Section: Introductionmentioning

confidence: 99%

Direct DC 10 V comparison between two programmable Josephson voltage standards made of niobium nitride (NbN)-based and niobium (Nb)-based Josephson junctions

et al. 2018

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“…One possible way to avoid cracks in the silicon chip is to use a sapphire substrate instead of a copper substrate because the coefficients of thermal expansion for silicon and sapphire are similar [27]. A sapphire substrate is used for the voltage primary standard at the National Metrology Institute of Japan [28]. However, there are some disadvantages to using sapphire, such as the requirement of an additional process for sputter-depositing gold film on the sapphire substrate for InSn solder bonding, and the high cost of sapphire, both of which increase packaging cost.…”

Section: Numerical Simulation Of Thermal Stressmentioning

confidence: 99%

Reliable packaging of Josephson voltage standard circuit for cryocooler operation

Yamamori

Maruyama

Amagai

et al. 2019

IEICE Electron. Express

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Reliable and easy fabricated packaging for a Josephson voltage standard circuit was proposed and the thermal stress and temperature distribution in the chip were numerically analyzed. The chip for programmable Josephson voltage standard circuits was bonded with InSn solder to a copper plate to achieve good thermal contact. Although this packaging allowed very good thermal contact, the chip sometimes broke due to thermal stress caused by a difference in the expansion coefficient between silicon and copper. Slits were thus added to the copper plate to reduce the thermal stress. The numerical analysis suggested that the slits reduce the thermal stress in the voltage standard chip, and thus reduce the risk of the chip cracking when it is cooled. The numerical analysis also suggested that the temperature increase in the chip was about 1 mK which caused a negligible reduction in the operating margin of the PJVS operation.

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“…Photograph of the NMIJ/AIST PJVS system (the national measurement standard of DC voltage equipped with a PJVS device (Fig. (c)) developed at the NMIJ/AIST …”

Section: Josephson Voltage Standardmentioning

confidence: 99%

“…Photograph of the NMIJ/AIST PJVS system (the national measurement standard of DC voltage equipped with a PJVS device ( Fig. 3(c)) developed at the NMIJ/AIST [63] with a relative standard uncertainty of 2.3×10 − 10 based on CODATA 2014 [30]. Here, c is the speed of light, c = 299 792 458 m/s.…”

Section: Principlementioning

confidence: 99%

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Review of quantum electrical standards and benefits and effects of the implementation of the ‘revised SI’

Kaneko

2017

IEEJ Transactions Elec Engng

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In the present International System of Units (SI), the Josephson effect and quantum Hall effect have been utilized for voltage and resistance primary standards, and the electrical current standard has been derived from a combination of the two quantum standards. In 2018, it is planned that the SI will be revised based on the latest measurements results of the Planck constant, elementary charge, Avogadro constant, and Boltzmann constant. The adoption of the 'Revised SI' means we shall finally terminate the traceability of the kilogram tied to an artifact (the international prototype of the kilogram) and start a new traceability of the kilogram to the Planck constant h. In electricity and magnetism metrology, and related precision measurements, the traceability presently based on the 'conventional values' of the Josephson constant and the von Klitzing constant is going to be switched to the revised traceability based on the Planck constant and elementary charge. In this article, the foundation of the quantum electrical measurements and how the Revised SI, which is based purely on fundamental physical constants and quantum effects, will bring us a long-term benefit with negligible impact to industry are detailed.

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Calibration System for Zener Voltage Standards Using a 10 V Programmable Josephson Voltage Standard at NMIJ

Cited by 11 publications

References 20 publications

Direct DC 10 V comparison between two programmable Josephson voltage standards made of niobium nitride (NbN)-based and niobium (Nb)-based Josephson junctions

Direct DC 10 V comparison between two programmable Josephson voltage standards made of niobium nitride (NbN)-based and niobium (Nb)-based Josephson junctions

Reliable packaging of Josephson voltage standard circuit for cryocooler operation

Review of quantum electrical standards and benefits and effects of the implementation of the ‘revised SI’

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