2019
DOI: 10.3103/s1068798x19030225
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Calibration of X-Ray Diffraction Instruments for Residual-Stress Measurement

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Cited by 5 publications
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“…Calculating σ = M•K, where K is the elasticity constant and M is the slope of the 2θ-sin2ϕ plot in the XRD pattern, yields the residual stress. [46,47]:…”
Section: Er Review 7 Of 14mentioning
confidence: 99%
See 1 more Smart Citation
“…Calculating σ = M•K, where K is the elasticity constant and M is the slope of the 2θ-sin2ϕ plot in the XRD pattern, yields the residual stress. [46,47]:…”
Section: Er Review 7 Of 14mentioning
confidence: 99%
“…Calculating σ = M•K, where K is the elasticity constant and M is the slope of the 2θ-sin2φ plot in the XRD pattern, yields the residual stress. [46,47]: There are several uses for the electrical energy that the PENG produces. Due to the high instantaneous voltage and current produced by the PENG, Figure 8a depicts 50 commercial light-emitting diodes (LEDs) being illuminated immediately by a 10% CBT/PVDF PENG without any charge storage (Video S1, Supplementary Materials).…”
Section: Er Review 7 Of 14mentioning
confidence: 99%