Calibration of the apparent temperature of silicon single crystals as a function of their true temperature and their thickness as determined by infrared measurements

Smither, R.K.; Fernandez, P.B.

doi:10.2172/10188457

1993

DOI: 10.2172/10188457

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Calibration of the apparent temperature of silicon single crystals as a function of their true temperature and their thickness as determined by infrared measurements

R.K. Smither¹,

P.B. Fernandez²

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Calibration of the apparent temperature of silicon single crystals as a function of their true temperature and their thickness as determined by infrared measurements

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