Calibration of oscillation amplitude in dynamic scanning force microscopy

Martínez, Juan Francisco González; Nieto-Carvajal, Inés; Colchero, J.

doi:10.1088/0957-4484/24/18/185701

Cited by 5 publications

(2 citation statements)

References 26 publications

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“…As the interferometric method is perfectly suited for the calibration of the cantilever oscillation amplitude, we exemplify the fit procedure and accuracy limits for the fit parameter 𝐴. Amplitude calibration means to relate the cantilever oscillation amplitude 𝐴 to the voltage 𝑉 𝑒𝑥𝑐 to yield the calibration factor 𝑆 = 𝐴/𝑉 𝑒𝑥𝑐 [14]. An accurate calibration is essential for quantitative NC-AFM and, therefore, various methods have been suggested to determine the calibration factor [10,[18][19][20][21].…”

Section: Resultsmentioning

confidence: 99%

Signal generation in dynamic interferometric displacement detection

Khachatryan,

Anter,

Reichling

et al. 2024

Preprint

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Laser interferometry is a well-established and widely used technique for precise displacement measurements. In a non-contact atomic force microscope (NC-AFM) it facilitates the force measurement by recording the periodic displacement of an oscillating micro-cantilever. To understand signal generation in a NC-AFM based on a Michelson type interferometer, we evaluate the non-linear response of the interferometer to the harmonic displacement of the cantilever in the time domain. As the interferometer signal is limited in amplitude due to the spatial periodicity of the interferometer light field, an increasing cantilever oscillation amplitude creates an output signal with an increasingly complex temporal structure. By the fit of a model to the measured time-domain signal, all parameters governing the interferometric displacement signal can be precisely determined. It is demonstrated, that such an analysis specifically allows the calibration of the cantilever oscillation amplitude with 0.15% accuracy.

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Section: Resultsmentioning

confidence: 99%

Signal generation in dynamic interferometric displacement detection

Khachatryan,

Anter,

Reichling

et al. 2024

Preprint

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“…On a smaller scale (image not shown) this sample shows the rounded structure of the polycrystalline platinum grains (ca. 20 nm lateral size, about 1 nm mean roughness, see for example [ 47 ]). A few higher structures (3–4 nm height) can be recognized in the topographic images.…”

Section: Resultsmentioning

confidence: 99%

In situ characterization of nanoscale contaminations adsorbed in air using atomic force microscopy

Lacasa¹,

Almonte²,

Colchero³

2018

Beilstein J. Nanotechnol.

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Under ambient conditions, surfaces are rapidly modified and contaminated by absorbance of molecules and a variety of nanoparticles that drastically change their chemical and physical properties. The atomic force microscope tip–sample system can be considered a model system for investigating a variety of nanoscale phenomena. In the present work we use atomic force microscopy to directly image nanoscale contamination on surfaces, and to characterize this contamination by using multidimensional spectroscopy techniques. By acquisition of spectroscopy data as a function of tip–sample voltage and tip–sample distance, we are able to determine the contact potential, the Hamaker constant and the effective thickness of the dielectric layer within the tip–sample system. All these properties depend strongly on the contamination within the tip–sample system. We propose to access the state of contamination of real surfaces under ambient conditions using advanced atomic force microscopy techniques.

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