Calibration of frictional forces in atomic force microscopy

Ogletree, D. Frank; Carpick, Robert W.; Salmerón, M.

doi:10.1063/1.1147411

Cited by 553 publications

(507 citation statements)

References 25 publications

(13 reference statements)

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“…Lateral forces were calibrated by the method described in Ref. 24. We used cantilevers coated with approximately 20-30 nm of TiN, with spring constants of 3.0 N / m for contact mode or 48 N / m for tunneling mode.…”

Section: Methodsmentioning

confidence: 99%

Elastic and inelastic deformations of ethylene-passivated tenfold decagonalAl−Ni−Coquasicrystal surfaces

et al. 2005

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The adhesion and friction force properties between a tenfold Al-Ni-Co decagonal quasicrystal and a titanium nitride (TiN)-coated tip were investigated using an atomic force microscope in ultrahigh vacuum. To suppress the strong chemical adhesion found in the clean quasicrystal surfaces, the sample was exposed to ethylene that formed a protective passivating layer. We show that the deformation mechanism of the tip-substrate junction changes from elastic to inelastic at a threshold pressure of 3.8 to 4.0 GPa. Images of the indentation marks left above the threshold pressure indicate the absence of new steps, and indicate that surface damage is not accompanied by formation of slippage planes or dislocations, as found in plastically deforming crystalline materials. This is consistent with the lack of translational periodicity of quasicrystals. The work of adhesion in the inelastic regime is five times larger than in the elastic one, plausibly as a result of the displacement of the passivating layer. In the elastic regime, the friction dependence on load is accurately described by the Derjaguin-Müller-Toporov (DMT) model, consistent with the high hardness of both the TiN tip and the quasicrystal sample. Above the threshold pressure, the friction versus load curve deviates from the DMT model, indicating that chemical bond formation and rupture contribute to the energy dissipation. The adhesion and friction force properties between a tenfold Al-Ni-Co decagonal quasicrystal and a titanium nitride ͑TiN͒-coated tip were investigated using an atomic force microscope in ultrahigh vacuum. To suppress the strong chemical adhesion found in the clean quasicrystal surfaces, the sample was exposed to ethylene that formed a protective passivating layer. We show that the deformation mechanism of the tip-substrate junction changes from elastic to inelastic at a threshold pressure of 3.8 to 4.0 GPa. Images of the indentation marks left above the threshold pressure indicate the absence of new steps, and indicate that surface damage is not accompanied by formation of slippage planes or dislocations, as found in plastically deforming crystalline materials. This is consistent with the lack of translational periodicity of quasicrystals. The work of adhesion in the inelastic regime is five times larger than in the elastic one, plausibly as a result of the displacement of the passivating layer. In the elastic regime, the friction dependence on load is accurately described by the Derjaguin-Müller-Toporov ͑DMT͒ model, consistent with the high hardness of both the TiN tip and the quasicrystal sample. Above the threshold pressure, the friction versus load curve deviates from the DMT model, indicating that chemical bond formation and rupture contribute to the energy dissipation.

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Section: Methodsmentioning

confidence: 99%

Elastic and inelastic deformations of ethylene-passivated tenfold decagonalAl−Ni−Coquasicrystal surfaces

et al. 2005

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“…Regardless of the direction of friction, the tensile stress induced by the friction always bends the cantilever toward the substrate. The cantilever is insensitive to the lateral component of the tensile stress since its sensitivity to the buckling force 1 / k x ͑x direction͒ is only 12% of its sensitivity to normal force 1 / k z ͑z direction͒ as estimated using the expression 3H / 2L, 48 where H and L are the cantilever tip height and the cantilever length, respectively. The deflection caused by the vertical component of the tensile stress can be calculated by using…”

Section: Scan Of Multiwalled Carbon Nanotube Tip On Tube Support Layermentioning

confidence: 99%

Adhesion and friction of a multiwalled carbon nanotube sliding against single-walled carbon nanotube

et al. 2008

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The adhesion and friction at crossed nanotube junctions were investigated in ambient by using an atomic force microscope ͑AFM͒ in tapping mode. A multiwalled carbon nanotube ͑MWNT͒ tip attached to a conventional AFM probe was scanned across a single-walled carbon nanotube ͑SWNT͒ suspended over a 2-m-wide trench. The interaction between nanotubes was found to critically depend on the morphology of the MWNT tip, which was determined from force-distance curves and scans performed against hard trench surface. The interaction between nanotubes caused the attenuation of vibrational amplitude of AFM cantilever, from which the frictional force between nanotubes was obtained by analyzing the dissipated vibrational power of cantilever. The adhesive force between nanotubes was measured from the vertical cantilever deflection when the MWNT tip end detached from the shell of the SWNT. From the friction and adhesion data, an experimental value of coefficient of friction of 0.006Ϯ 0.003 is obtained for the sliding between nanotubes, which is comparable to the reported value of graphite on nanoscale. The shear strength between nanotubes is derived to be 4 Ϯ 1 MPa by using a continuum model, which is in accordance with the value of 2 MPa reported for the sliding of MWNT on graphite in ambient. It is nearly 2 orders of magnitude larger than the interlayer shear strength of 0.05 MPa reported for MWNT in vacuum. We attribute the difference between the intertube and the interlayer frictions to the presence of water at the nanotube-nanotube interface in ambient.

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“…Normal cantilever force constants were taken from the manufacturer and the normal/lateral force ratio was calculated using the method described by Ogletree et al [24]. Although the absolute accuracy of the forces measured is limited, the relative changes in friction could be accurately determined by using the same cantilever and tip during a series of measurements.…”

Section: Atomic Force Microscopy Study Of An Ideally Hard Contactmentioning

confidence: 99%

Atomic Force Microscopy Study of an Ideally Hard Contact: The Diamond(111)/Tungsten Carbide Interface

et al. 1998

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A comprehensive nanotribological study of a hydrogen-terminated diamond(111)/tungsten carbide interface has been performed using ultrahigh vacuum atomic force microscopy. Both contact conductance, which is proportional to contact area, and friction have been measured as a function of applied load. We demonstrate for the first time that the load dependence of the contact area in UHV for this extremely hard single asperity contact is described by the Derjaguin-Müller-Toporov continuum mechanics model. Furthermore, the frictional force is found to be directly proportional to the contact area. Comments

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Calibration of frictional forces in atomic force microscopy

Cited by 553 publications

References 25 publications

Elastic and inelastic deformations of ethylene-passivated tenfold decagonalAl−Ni−Coquasicrystal surfaces

Elastic and inelastic deformations of ethylene-passivated tenfold decagonalAl−Ni−Coquasicrystal surfaces

Adhesion and friction of a multiwalled carbon nanotube sliding against single-walled carbon nanotube

Atomic Force Microscopy Study of an Ideally Hard Contact: The Diamond(111)/Tungsten Carbide Interface

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