Calibration Method for X-Ray Fluorescence Spectrometry

Beattie, H. J.; Brissey, R. M.

doi:10.1021/ac60090a009

Cited by 132 publications

(32 citation statements)

References 2 publications

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“…[37][38][39][40] The probability that a photon of energy h in hitting the sample surface at an angle of h in will get absorbed within the sample by an atom of an element (denoted by l 0 ) and that subsequently this atom will emit a Ka fluorescence photon of energy h Ka;l 0 that leaves the sample at an angle h out is given by…”

Section: Acknowledgmentsmentioning

confidence: 99%

In situ analysis of elemental depth distributions in thin films by combined evaluation of synchrotron x-ray fluorescence and diffraction

Mainz

2011

Journal of Applied Physics

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In this work we present a method for the in situ analysis of elemental depth distributions in thin films using a combined evaluation of synchrotron x-ray fluorescence and energy-dispersive x-ray diffraction signals. We recorded diffraction and fluorescence signals simultaneously during the reactive annealing of thin films. By means of the observed diffraction signals, the time evolution of phases in the thin films during the annealing processes can be determined. We utilized this phase information to parameterize the depth distributions of the elements in the films. The timedependent fluorescence signals were then taken to determine the parameters representing the parameterized depth distributions. For this latter step, we numerically calculated the fluorescence intensities for a given set of depth distributions. These calculations handle polychromatic excitation and arbitrary functions of depth distributions and take into account primary and secondary fluorescence. Influences of lateral non-uniformities of the films, as well as the accuracy limits of the method, are investigated. We apply the introduced method to analyze the evolution of elemental depth distributions and to quantify the kinetic parameters during a synthesis process of CuInS 2 thin films via the reactive annealing of Cu-In precursors in a sulfur atmosphere.

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Section: Acknowledgmentsmentioning

confidence: 99%

In situ analysis of elemental depth distributions in thin films by combined evaluation of synchrotron x-ray fluorescence and diffraction

Mainz

2011

Journal of Applied Physics

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“…Steel rings 4.5 mm thick were used as sample holders to satisfy the assumption of infinite thickness of the sample, which is necessary for equation (2). Sample holders were made large enough not to intercept the excitation radiation and were checked by blank tests.…”

Section: Experimental Procedures and Resultsmentioning

confidence: 99%

“…TUNCER, T. DEM1REL and R. A. LOHNES The expression, (t~pcsc4)v + #:csc~p:), in equation (1) accounts for absorption and enhancement, which was verified experimentally by Beattie and Brissey (1954). Now, if L is allowed to go to infinity and p~/p is expressed by x, which is the weight fraction of the element to be measured, equation (1) becomes simply:…”

Section: Theorymentioning

confidence: 96%

Quantitative Analysis of Elements in Sediments and Soils by X-Ray Fluorescence

Tuncer

1977

Clays and clay miner.

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Abstrac~Previous applications of the method of known additions for quantitative X-ray fluorescent analysis have assumed a linear relationship between peak intensity and concentration of the element being analyzed. This assumption is true for soils or sediments containing small amounts of the element in question. In this paper, an equation is derived which takes into account both absorption and enhancement and thus is applicable to samples containing high concentrations of the element. The equation was tested by analyzing an artificial soil sample containing 60% kaolinite and 40% hematite, i.e. the sample contained 28% by weight iron. The fluorescent analysis utilizing the equation derived here resulted in an iron content of 27%. In addition, nine soils from Hawaii were analyzed by this method and the results of these analyses compared with analyses by atomic absorption. The agreement between the two methods is good. It is concluded that the method and equations proposed here provides a reliable measurement of elements in a soil sample which contains high concentrations of the elements in question.

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“…Both the influence coefficient and fundamental parameter techniques require a computer for their application. In principle, an empirical correction procedure can be described as the correction of an analyte element intensity for the influence of interfering elements, using the product of the intensity from the interfering element line and a constant factor, as the correction term [14]. This constant factor is today generally referred to as an influence coefficient, since it is assumed to represent the influence of the interfering element on the analyte.…”

Section: Quantitative Analysismentioning

confidence: 99%

X-Ray Fluorescence Spectrometry

Jenkins

2000

Ullmann's Encyclopedia of Industrial Chemistry

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Calibration Method for X-Ray Fluorescence Spectrometry

Cited by 132 publications

References 2 publications

In situ analysis of elemental depth distributions in thin films by combined evaluation of synchrotron x-ray fluorescence and diffraction

In situ analysis of elemental depth distributions in thin films by combined evaluation of synchrotron x-ray fluorescence and diffraction

Quantitative Analysis of Elements in Sediments and Soils by X-Ray Fluorescence

X-Ray Fluorescence Spectrometry

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