1977
DOI: 10.1016/0021-9797(77)90319-8
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Calculations of van der Waals forces in thin liquid films using Lifshitz' theory

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Cited by 66 publications
(22 citation statements)
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“…This calculation can easily be generalized to an arbitrary number of electrolyte free layers simply by calculating recursively the value of B(p) generated by the composition of all the layers before arriving at the penultimate layer before the film. In the case of no surface interaction and no electrolyte this result agrees with the calculation of the zero frequency contribution to the van der Waals force in [8,29].…”
Section: The Triple Layersupporting
confidence: 88%
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“…This calculation can easily be generalized to an arbitrary number of electrolyte free layers simply by calculating recursively the value of B(p) generated by the composition of all the layers before arriving at the penultimate layer before the film. In the case of no surface interaction and no electrolyte this result agrees with the calculation of the zero frequency contribution to the van der Waals force in [8,29].…”
Section: The Triple Layersupporting
confidence: 88%
“…The total length of the system in the z direction is denoted by U and therefore T = U − L. To start with, we ignore the fact that just outside the surface one has a density of hydrocarbon tails (this will be taken into account very simply later on). The calculation for a triple layer in the absence of surface charging and electrolyte can be found in [27,29]. In this two layer picture therefore, the dielectric constant has the form ǫ(x) = ǫ for x ∈ A × L where ǫ is the dielectric constant of the electrolyte solution, which in the dilute limit we shall take to be the dielectric concentration of water.…”
Section: The Model and Surface-charging Mechanismsmentioning
confidence: 99%
“…However, because of eq. ( 36), "lateral" and "vertical" contributions should be considered simultaneously, at least in principle, as hinted already long ago [5]: On the basis of a numerical study of van der Waals attractions indicating that the Hamaker constant actually depends on surface coverage [57], it was then suggested that the optimal coverage Γ opt not only depends on φ 0 , but could also depend on film thickness even though any "significant dependence" was ruled out [5].…”
Section: Peristaltic Fluctuationsmentioning
confidence: 99%
“…P, is experimentally measured and//vw is estimated using a model for molecular interactions applicable to foam films. For the lack of a suitable model for a precise, and, at the same time, comparatively simple calculation of van der Waals interactions in foam films stabilized with phospholipids,//vw can be estimated using the empirical equation proposed by Donners et al (1977) for foam films stabilized with amphiphilic surface active substances. This equation is a result of numerically solving the complete equations of the macroscopic theory of van der Waals attraction in films (Dzyaloshinskii et al 1961) where the film structure is taken into consideration and the frequency dependence of the permittivity is estimated according to the method proposed by Ninham and Parsegian (1970).…”
Section: = Oj + H~omentioning
confidence: 99%