1995
DOI: 10.1109/4.391126
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Calculation of the soft error rate of submicron CMOS logic circuits

Abstract: As a prerequisite for predicting the soft-error rate (SER) of CMOS circuits with dynamic registers a method to calculate the SER is presented which takes into account charge collection by drift and diffusion. It has been found that besides collection due to drift, the noise charge collected by diffusion has to be considered to accurately predict the SER of dynamic CMOS circuits. Calculated results are compared to device simulations and SER measurements.

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Cited by 39 publications
(15 citation statements)
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“…Technology trends will raise soft-error rates in microprocessors to levels that require changes to the design and implementation of future computer systems [12,17,23]. Detecting soft-errors in the processor's core logic presents a more difficult challenge than errors in storage or interconnect devices, which can be handled via error detecting and correcting codes.…”
Section: Introductionmentioning
confidence: 99%
“…Technology trends will raise soft-error rates in microprocessors to levels that require changes to the design and implementation of future computer systems [12,17,23]. Detecting soft-errors in the processor's core logic presents a more difficult challenge than errors in storage or interconnect devices, which can be handled via error detecting and correcting codes.…”
Section: Introductionmentioning
confidence: 99%
“…However, increasing levels of integration, diminishing node capacitance, and reduced noise margins have led researchers to forecast an exponential increase in the soft-error rate for unprotected logic and flip-flop circuits [10,19]. Recent work [9,14,22] advocates leveraging the inherent replication of processor cores in a CMP for soft-error tolerant redundant execution by pairing cores and checking their execution results.…”
Section: Introductionmentioning
confidence: 99%
“…Furthermore, by waiting for outstanding transactions to complete, SafetyNet avoids checkpointing transient coherence states and in-flight messages. [28,36,49]). The fault may corrupt the message while it is stored in a switch buffer or by disrupting a switch's internal logic.…”
Section: Creating Consistent Checkpointsmentioning
confidence: 99%