Abstract:Articles you may be interested inMethod to calculate electric fields at very small tip-sample distances in atomic force microscopy Appl. Phys. Lett. 97, 033115 (2010); Theoretical calculation and experimental observation of stark profiles of Argon spectral lines for the measurements of electric fields in a discharge plasma AIP Conf.The application of the method of images to the calculation of electric field in arrangements of intersecting conducting spheres is presented. The multipole re-expansions are utilize… Show more
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