Calculation Of Surface Statistics From Light Scatter

Stover, John C.; Serati, Steven A.; Gillespie, Calvin H.

doi:10.1117/12.7973309

Cited by 61 publications

(24 citation statements)

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“…The orientation of polishing was determined from a light scatter surface roughness measurement. 28 The RMS surface roughness of a freshly polished copper coupons was 0.015 pm. After exposure to air for several weeks, the RMS surface roughness increased to 0.17 pm.…”

Section: Coppermentioning

confidence: 99%

Characterization of initial events in bacterial surface colonization by two Pseudomonas species using image analysis

Mueller

Characklis

Jones

et al. 1992

Biotech & Bioengineering

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The processes leading to bacterial colonization on solid-water interfaces are adsorption, desorption, growth, and erosion. These processes have been measured individually in situ in a flowing system in real time using image analysis. Four different substrata (copper, silicon, 316 stainless-steel and glass) and 2 different bacterial species (Pseudomonas aeruginosa and Pseudomonas fluorescens) were used in the experiments. The flow was laminar (Re = 1.4) and the shear stress was kept constant during all experiments at 0.75 N m(-2). The surface roughness varied among the substrata from 0.002 microm (for silicon) to 0.015 microm (for copper). Surface free energies varied from 25.1 dynes cm(-1) for silicon to 31.2 dynes cm(-1) for copper. Cell curface hydrophobicity, reported as hydrocarbon partitioning values, ranged from 0.67 for Ps. fluorescens to 0.97 for Ps. aeruginosa.The adsorption rate coefficient varied by as much as a factor of 10 among the combinations of bacterial strain and substratum material, and was positively correlated with surface free energy, the surface roughness of the substratum, and the hydrophobicity of the cells. The probability of desorption decreased with increasing surface free energy and surface roughness of the substratum. Cell growth was inhibited on copper, but replication of cells overlying an initial cell layer was observed with increased exposure time to the cell-containing bulk water. A mathematical model describing cell accumulation on a substratum is presented.

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Section: Coppermentioning

confidence: 99%

Characterization of initial events in bacterial surface colonization by two Pseudomonas species using image analysis

Mueller

Characklis

Jones

et al. 1992

Biotech & Bioengineering

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“…Many of the works on inverse scattering have focused on the retrieval of some statistical properties of the surface under study [8,9,10,11,12]. The reconstruction of surface profiles from far-field amplitude data has been considered by Wombel and DeSanto [13,14], Quartel and Sheppard [15,16], and Macías et al [17].…”

Section: Introductionmentioning

confidence: 98%

Surface Profile Reconstruction from Scattered Intensity Data Using Evolutionary Strategies

Macı́as

Olague

Mendez

2002

Lecture Notes in Computer Science

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Abstract. We present a study of rough surface inverse scattering problems using evolutionary strategies. The input data consists of far-field angle-resolved scattered intensity data, and the objective is to reconstruct the surface profile function that produced the data. To simplify the problem, the random surface is assumed to be one-dimensional and perfectly conducting. The optimum of the fitness function is searched using the evolutionary strategies (µ, λ) and (µ + λ). On the assumption that some knowledge about the statistical properties of the unknown surface profile is given or can be obtained, the search space is restricted to surfaces that belong to that particular class. In our case, as the original surface, the trial surfaces constitute realizations of a stationary zeromean Gaussian random process with a Gaussian correlation function. We find that, for the conditions and parameters employed, the surface profile can be retrieved with high degree of confidence. Some aspects of the convergence and the lack of uniqueness of the solution are also discussed.

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“…Different optical techniques were used to measure surface roughness. The lightscattering technique for surface roughness measurements has received wide attention in the past few decades [9][10][11][12][13][14][15]. The theoretical background of this technique is based on Beckmann's rough-surface scattering model [16,17].…”

Section: Introductionmentioning

confidence: 99%