2014
DOI: 10.1016/j.tsf.2013.11.103
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Calculation of dispersion of surface and interface phonon polariton resonances in wurtzite semiconductor multilayer system taking damping effects into account

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Cited by 4 publications
(2 citation statements)
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“…These parameters are obtained from the previous publications. [16,30,31] ε ∞ ω LO /cm −1 ω TO /cm −1 γ LO /cm −1 γ TO /cm For the hybrid structure, we consider a 100-nm-thick hBN thin film as the hyperbolic layer. The resonant surface modes can be determined by the poles of the reflection coefficients and the mode dispersion patterns of the hybrid structure are obtained by plotting the imaginary part of the reflection coefficient r. [27,32] The results are given in Fig.…”
Section: With the Hbn Hyperbolic Layermentioning
confidence: 99%
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“…These parameters are obtained from the previous publications. [16,30,31] ε ∞ ω LO /cm −1 ω TO /cm −1 γ LO /cm −1 γ TO /cm For the hybrid structure, we consider a 100-nm-thick hBN thin film as the hyperbolic layer. The resonant surface modes can be determined by the poles of the reflection coefficients and the mode dispersion patterns of the hybrid structure are obtained by plotting the imaginary part of the reflection coefficient r. [27,32] The results are given in Fig.…”
Section: With the Hbn Hyperbolic Layermentioning
confidence: 99%
“…Taking the free carriers and anisotropy into account, the dielectric function model of wurtzite ZnO can be expressed as the same as AlN. [31] However, we use a moderate damping constant when the single crystal ZnO is fabricated. In our calculation, the ZnO thickness is set to be 300 nm.…”
Section: With the Zno Hyperbolic Layermentioning
confidence: 99%