2016
DOI: 10.1039/c6cp06340c
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Bulk molybdenum field emitters by inductively coupled plasma etching

Abstract: In this work we report on the fabrication of inductively coupled plasma (ICP) etched, diode-type, bulk molybdenum field emitter arrays. Emitter etching conditions as a function of etch mask geometry and process conditions were systematically investigated. For optimized uniformity, aspect ratios of >10 were achieved, with 25.5 nm-radius tips realised for masks consisting of aperture arrays some 4.45 μm in diameter and whose field electron emission performance has been herein assessed.

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Cited by 8 publications
(4 citation statements)
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“…For brevity, as shown in Figure 5 a, a double-side-polished, 400 mm thick, 4-inch high purity (99.95%) Mo wafer was first coated with an evaporated 500 nm thick Al film to form etch mask. The tip array was subsequently patterned by photolithography ( Figure 5 b,c), with the Al patterned by dry etching in CH 3 F plasma ( Figure 5 d) [ 36 ]. The Mo tip array was etched using an anisotropic SF 6 dry etch in a commercial ICP etcher (Sentech PTSA 500, SENTECH Instruments GmbH, Berlin, Germany) ( Figure 5 e).…”
Section: Fabrication Processes and Morphology Propertiesmentioning
confidence: 99%
“…For brevity, as shown in Figure 5 a, a double-side-polished, 400 mm thick, 4-inch high purity (99.95%) Mo wafer was first coated with an evaporated 500 nm thick Al film to form etch mask. The tip array was subsequently patterned by photolithography ( Figure 5 b,c), with the Al patterned by dry etching in CH 3 F plasma ( Figure 5 d) [ 36 ]. The Mo tip array was etched using an anisotropic SF 6 dry etch in a commercial ICP etcher (Sentech PTSA 500, SENTECH Instruments GmbH, Berlin, Germany) ( Figure 5 e).…”
Section: Fabrication Processes and Morphology Propertiesmentioning
confidence: 99%
“…The FEA after photoresist stripping is shown in Figure 3 e. The surface was flat with no noticeable residues. The Mo FEA tips were etched by SF 6 /Ar dry etching as shown in Figure 3 f and Figure 4 b. Optimized ICP etcher process conditions, such as pressure, plasma power and gas flows, are reported elsewhere [ 26 ]. In the last process step as shown in Figure 3 g and Figure 4 c, ultrasonic agitation of 15 W was used to remove the sacrificial SiO 2 /Al stack.…”
Section: Fabrication Processesmentioning
confidence: 99%
“…Inspired by the deep etching process of silicon, efforts have been made in our previous work. Similar to molybdenum-based field emission arrays, fluoric ICP was employed to etch bulk tungsten [ 48 , 49 , 50 ]. Micro-needle arrays were initially achieved by isotropic etching, and high-aspect-ratio microstructures were micromachined by a mixed reactive plasma of SF 6 and C 4 F 8 [ 51 , 52 , 53 ].…”
Section: Introductionmentioning
confidence: 99%