Our system is currently under heavy load due to increased usage. We're actively working on upgrades to improve performance. Thank you for your patience.
2001
DOI: 10.1016/s0030-4018(01)01493-6
|View full text |Cite
|
Sign up to set email alerts
|

Bulk-film structural differences of chalcogenide glasses probed in situ by near-infrared waveguide Raman spectroscopy

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

2
34
0

Year Published

2003
2003
2009
2009

Publication Types

Select...
4
2
1

Relationship

0
7

Authors

Journals

citations
Cited by 44 publications
(36 citation statements)
references
References 12 publications
2
34
0
Order By: Relevance
“…In addition to surface roughness we believe that the thin-film composition is more inhomogeneous than the bulk glass due to dissociation during evaporation and rapid cooling under vacuum. [14,15] This leads to an increase in disorder and of the density of localized states in the band tail reducing further the free-carrier average drift mobility. [16,17] From Figure 3 we see that increasing the film thickness increases I ph -…”
Section: Metal Metalmentioning
confidence: 99%
“…In addition to surface roughness we believe that the thin-film composition is more inhomogeneous than the bulk glass due to dissociation during evaporation and rapid cooling under vacuum. [14,15] This leads to an increase in disorder and of the density of localized states in the band tail reducing further the free-carrier average drift mobility. [16,17] From Figure 3 we see that increasing the film thickness increases I ph -…”
Section: Metal Metalmentioning
confidence: 99%
“…The material of interest is cast into a slab waveguide, thereby significantly increasing both the scattering volume and the electrical field intensity within the film. In spite of its sensitivity, waveguide Raman spectroscopy (WRS) using guided mode excitation [29,30] has not been applied to the structural characterization of chalcogenide glasses until recently [31,32]. Discussed here are selective results of such experiments where chalcogenide film Raman spectra were measured using guided mode excitation.…”
Section: Raman Spectroscopymentioning
confidence: 99%
“…The refractive index of these organic and oxide materials allows the use of high-index glass prisms such as LaSF5 (n ∼ 1.8) for coupling a range of propagation vectors into the waveguide structure. In spite of its sensitivity, WRS has not been applied to the structural characterization of chalcogenide glasses until recently [31,32] most likely owing to their high index (∼2.45) and lack of suitable prism couplers and difficulties associated with working in the near-infrared. Figure 23.8 illustrates the variation in Raman spectra obtained in an As 2 S 3 channel (film) waveguide structure, as probed across the waveguide endface.…”
Section: Nir Waveguide and Micro-raman Spectroscopy Of Chalcogenide Fmentioning
confidence: 99%
“…Chalcogenide glasses have drawn great interest for potential use in next generation photonics applications including all-optical switching and regeneration, due to their high refractive indices, high non-linearities, magneto-optic coefficients and transparency in the infrared [1][2][3]. Ge 33 As 12 Se 55 has proven to have high non-linearity [4] and large magneto-optic coefficient [5].…”
Section: Introductionmentioning
confidence: 99%