2009
DOI: 10.1051/epjap:2008187
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Bulge test and AFM point deflection method, two technics for the mechanical characterisation of very low stiffness freestanding films

Abstract: International audienceThe aim of this work is to compare several methods for the determination of very thin films Young's modulus and stress state: the nanoindentation test, the bulge test and the point-deflection method. The tested structures were silicon nitride and silicon nitride/silicon oxide bilayer membranes with different shapes (square or rectangular) and dimensions (from 1 mm to 3 mm). We report new experimental results on submicron thick dielectric membranes with thicknesses down to 100 nm. A Young'… Show more

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Cited by 19 publications
(11 citation statements)
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“… Bulge tests with freestanding polymer carpets yield their Young's modulus. a) The applied pressure as function of the carpet deflection (squares) follows the calculated dependency of thin membranes under tension38 (line) and allows the extraction of the Young's modulus. The inset shows a scheme of the measurement setup.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“… Bulge tests with freestanding polymer carpets yield their Young's modulus. a) The applied pressure as function of the carpet deflection (squares) follows the calculated dependency of thin membranes under tension38 (line) and allows the extraction of the Young's modulus. The inset shows a scheme of the measurement setup.…”
Section: Resultsmentioning
confidence: 99%
“…Figure 8b shows a clear relation between the Young's modulus and the thickness of the polymer‐carpet layer. It must be pointed out that a polymer carpet is a composite membrane consisting of a crosslinked biphenyl monolayer with a soft polymer‐brush layer and that the measured elastic modulus is a thickness‐weighted average between the two compounds 38. Since the Young's modulus of a single 1‐nm‐thick cABT nanosheet was measured to be 8 GPa, the Young's modulus of the PS component can be calculated (red circles in Figure 8b).…”
Section: Resultsmentioning
confidence: 99%
“…Both methods have a resolution in the range of hundreds of nanometers. Atomic force microscopy (AFM) has also been used for indentation studies on soft [ 14 ] as well as stiff [ 15 ] membranes. In addition, it was recently reported that the curvature of a bulged membrane was determined by AFM, while its deflection was measured with a laser sensor [ 16 ].…”
Section: Introductionmentioning
confidence: 99%
“…in the hard X-ray domain), one can use thicker membranes to limit the bulging and reach the electronic equilibrium in the medium which ensures a proper dosimetric measurement (Carlsson, 1985). For example, using 3 mm-thick Si 3 N 4 windows will limit the deformation to 1/20th of the one observed here (Martins et al, 2009), i.e. to less than 350 nm, while allowing to work with X-rays down to 10 keV [their secondary electrons have ranges of about 1.5 mm in Si 3 N 4 (Berger et al, 2005)].…”
Section: Discussionmentioning
confidence: 95%