Proceedings of the 3rd India Software Engineering Conference 2010
DOI: 10.1145/1730874.1730879
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Cited by 15 publications
(1 citation statement)
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“…Nagappan showed a strong correlation between the static analysis defect density and the pre-release defect density determined by testing. Sinha, Sinha, and Rao (2010) presented a new approach for determining the origins of a bug, based on the effects a bug fix has on program dependencies, and based on those effects, attempts to determine the previous bug-introducing version.…”
Section: Motivation and Related Workmentioning
confidence: 99%
“…Nagappan showed a strong correlation between the static analysis defect density and the pre-release defect density determined by testing. Sinha, Sinha, and Rao (2010) presented a new approach for determining the origins of a bug, based on the effects a bug fix has on program dependencies, and based on those effects, attempts to determine the previous bug-introducing version.…”
Section: Motivation and Related Workmentioning
confidence: 99%