2006
DOI: 10.1016/j.cplett.2006.05.056
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Broadening of vibrational levels in X-ray absorption spectroscopy of molecular nitrogen in compound semiconductors

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Cited by 25 publications
(25 citation statements)
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“…5). 30 Therefore, the N 1s XPS and the N K-edge NEXAFS spectra support the idea that nitrogen atoms trapped in N-doped TiO 2 nanoribbons may combine to form N 2 molecules evolving into the gas phase upon heating at elevated temperatures. 6).…”
Section: Resultsmentioning
confidence: 60%
See 1 more Smart Citation
“…5). 30 Therefore, the N 1s XPS and the N K-edge NEXAFS spectra support the idea that nitrogen atoms trapped in N-doped TiO 2 nanoribbons may combine to form N 2 molecules evolving into the gas phase upon heating at elevated temperatures. 6).…”
Section: Resultsmentioning
confidence: 60%
“…29 The features of these Ti L-edge indicate that the coordination environment of the titanium atoms in the N-doped TiO 2 samples corresponds to Ti(IV) in a tetragonal structure as suggested by the XPS measurements. 24,30,31 The peak at 400.8 eV of the gas phase N 2 molecules was assigned to a transition from the N 1s to p* orbital and the ne feature is a hallmark of N 2 molecule due to its vibrational structure. 5).…”
Section: Resultsmentioning
confidence: 99%
“…[12,18] The effective c-axis of the confining space is infinite, which should-unlike a tight c-axis-have no effect on the line shape. [19,20] The unchanged lifetime of the X-ray-excited π states, as well as the unaltered vibrational levels, are in-line with one-dimensional containment.…”
Section: Resultsmentioning
confidence: 68%
“…The RL was attributed to transitions to final states related to N dangling bonds since its characteristics (energy position and full width at half maximum) were independent of the projectile and due to its similarity with the RL observed in the electron energy loss spectra recorded from the core of threading dislocations [18]. Furthermore, a similar RL, attributed to 1s → * transitions of N 2 trapped in the semiconductor, has been detected in the surface sensitive electron yield spectra of bulk semiconductors bombarded with low energy N 2 + [19,20] and in N doped ZnO after annealing [21]. Finally Nord et al [22] used molecular dynamics calculations to predict N segregation in ion implanted GaN while N 2 bubbles formed after 2 and 4.7 MeV Au implantation into GaN are apparent in transmission electron micrographs [8,23].…”
Section: Ss (Mro) Ssmentioning
confidence: 65%