2000
DOI: 10.1063/1.372581
|View full text |Cite
|
Sign up to set email alerts
|

Broadband permeability measurement of ferromagnetic thin films or microwires by a coaxial line perturbation method

Abstract: A new method to measure the microwave permeability of ferromagnetic thin film or microwires from 50 MHz up to 18 GHz is presented. In contrast with all previous permeameters based on perturbation techniques, our permeameter does not require any reference sample for calibration, which is a definite advantage, as it is very difficult to have a reference magnetic sample of known permeability. In our technique, a network analyzer detects the small perturbation of the impedance of a coaxial line cell loaded by the … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
15
0

Year Published

2002
2002
2009
2009

Publication Types

Select...
6
1

Relationship

3
4

Authors

Journals

citations
Cited by 29 publications
(15 citation statements)
references
References 9 publications
0
15
0
Order By: Relevance
“…Corrected measurements for the reduction of the sample size are detailed in Ref. [17] The samples are composed of periodically spaced metamaterial blocks so that the sample complies with the symmetry and the field configuration of the measurement setup (details in Fig. 7).…”
Section: Methodsmentioning
confidence: 99%
“…Corrected measurements for the reduction of the sample size are detailed in Ref. [17] The samples are composed of periodically spaced metamaterial blocks so that the sample complies with the symmetry and the field configuration of the measurement setup (details in Fig. 7).…”
Section: Methodsmentioning
confidence: 99%
“…However, this technique is ill suited for conductive materials, particularly when the sample under study is a low-resistive film [1]. For metal films deposited on a flexible polymer substrate, coaxial line perturbation method has good performance [2]. Whereas for the magnetic thin films deposited on rigid substrate, the planar transmission-line (i.e., microstrip [3][4][5]) methods are more suitable.…”
Section: Introductionmentioning
confidence: 99%
“…In that case, standard measurement procedure (R/T, TEM calculations) gives the effective properties of the medium between the alumina layers (air+ferrite). Using static-like calculations, the intrinsic properties of the material samples are deduced [4].…”
Section: Measurement Setupmentioning
confidence: 99%