2014 37th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO) 2014
DOI: 10.1109/mipro.2014.6859542
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Broadband characterization of SMA connectors by measurements

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Cited by 7 publications
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“…This proposed SDI measurement system will verify this specification as shown in the following subsection. The interconnection between any DUT or RF discrete components to the VNA-SDI measurement system must be equipped with SMA 3.55 mm port type which is widely used in metrology instruments or production [17].…”
Section: Dutmentioning
confidence: 99%
“…This proposed SDI measurement system will verify this specification as shown in the following subsection. The interconnection between any DUT or RF discrete components to the VNA-SDI measurement system must be equipped with SMA 3.55 mm port type which is widely used in metrology instruments or production [17].…”
Section: Dutmentioning
confidence: 99%