Breakdown voltages of polymers in the temperature range 23°-250°C

Raju, Gorur Govinda; Katebian, A.; Jafri, S.Z.

doi:10.1109/tdei.2003.1176573

Cited by 35 publications

(8 citation statements)

References 6 publications

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“…Similar deviation from a single Weibull distribution has been previously reported for e.g. BOPP, PI (polyimide) and PTFE (polytetrafluoroethylene) films [11,[19][20]. This deviation suggests that the breakdowns may be due to more than one breakdown mechanisms and that a single 2-parameter Weibull distribution is in fact insufficient for representing such a breakdown data set.…”

Section: Data Selection Threshold ( ) a Minsupporting

confidence: 77%

“…As the measurement method yields a large amount of breakdown data from a relatively small amount of samples, the empirical breakdown distributions shown in Fig. 9 are very detailed and various different types of breakdown patterns may be identified, similarly as in [7], [8], [11] and [20]. For example, BOPP-6 clearly shows a distinct defect population at the low-probability region which can be seen as the curvature (or S-shape) of the theoretical distributions (Fig.…”

Section: Data Selection Threshold ( ) a Minmentioning

confidence: 96%

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Effect of Film Thickness and Electrode Area on the Dielectric Breakdown Characteristics of Metallized Capacitor Films

Rytöluoto¹,

Lahti²

2018

NORD-IS

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An alternative approach for measuring breakdown characteristics of metallized and non-metallized polymer films has been previously developed at TUT. The method enables measurement of multiple breakdowns beyond the weakest point of each sample film by utilizing low-energy self-healing breakdown of metallized film. The method yields a large amount of breakdown data even from a relatively small sample area which enables the formation of detailed material-specific breakdown fingerprints. In this paper, some preliminary results of an ongoing further research on the area and thickness dependence of the breakdown characteristics of various polymer films are presented.Dielectric polymer films utilized in film capacitors are subjected to very high electric field stresses and thus, accurate statistical knowledge of their breakdown characteristics at the low breakdown probability region is of utmost importance in order to ensure safe and reliable design and operation in practice [1][2][3][4]. Breakdown measurement is typically realized as a short-term rampto-breakdown measurement and Weibull or other extreme-value distributions are then utilized for statistical analysis of the breakdown data [5]. However, weak spots in the polymer film due to the internal morphology and inherent properties of the polymer itself or due to extrinsic factors such as defects, voids, chemical impurities and non-ideal processing conditions can lead to a large deviation in the breakdown strength [6]. Moreover, the area and volume dispersion of the weak points in the film further complicates the dielectric strength evaluation [7][8][9]. Therefore, a large amount of breakdown data is required from a relatively large test area in order to gain a sufficient statistical relevance for practical applications. One approach for obtaining a large amount of breakdown data is to utilize an automatic breakdown strength measurement system such as in [10][11]. However, especially when the development and optimization phase of new dielectric materials such as polymer nanocomposites is considered, weak spots due to non-ideal processing conditions or other external factors may have a deteriorating effect on the dielectric breakdown strength [12]. Moreover, as the amount of sample material available for breakdown measurement may be scarce, the dielectric breakdown strength determined with only a small number of parallel samples may be misleading as it may be more representative of the weak spots due to extrinsic factors rather than a measure of the inherent properties of the material. Consequently, the true potential of the new dielectric may not be revealed completely. In return to this problem, an alternative approach for measuring breakdown characteristics of thin polymer films has been previously developed at TUT [13]. The method is based on the concept of measuring multiple breakdowns per sample film beyond the weakest point (or dielectric strength) of each film by utilizing lowenergy self-healing breakdown of metallized polymer film which effectively reduces ...

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Section: Data Selection Threshold ( ) a Minsupporting

confidence: 77%

Section: Data Selection Threshold ( ) a Minmentioning

confidence: 96%

Effect of Film Thickness and Electrode Area on the Dielectric Breakdown Characteristics of Metallized Capacitor Films

Rytöluoto¹,

Lahti²

2018

NORD-IS

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“…The mechanisms of electrical failure of insulators are considerably different between DC and AC power systems [4]. Therefore, the breakdown is hard to predict owing to various factors such as morphology of the insulator [5], the amount of injected charge in the insulator and electrode interface characteristics, local electric field distortion due to accumulated space charge in the insulator, temperature gradient [6][7][8], thickness of the insulator [9][10][11], operating time, and waveform of the applied voltage [12]. These factors are nonlinearly involved in the breakdown phenomenon.…”

Section: Introductionmentioning

confidence: 99%

Finite Element Analysis of the Breakdown Prediction for LDPE Stressed by Various Ramp Rates of DC Voltage Based on Molecular Displacement Model

Kim¹,

Kim²,

Lee³

2020

Energies

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Predicting the electrical breakdown of polymers is critical for certifying the endurance and lifetime of high voltage power equipment. Since various factors contribute nonlinearly to the breakdown phenomena of polymer insulators, it is difficult to assess the impact of each factor independently. In this study, we numerically analyzed the breakdown phenomenon because of the ramp rate of the DC voltage applied to a polymer insulator, low-density polyethylene (LDPE), using the finite element method (FEM). To predict the breakdown initiation, we analyzed the relaxation time of the conduction current through the insulator as a significant indicator. The bipolar charge transport (BCT) model was used to analyze the charge behavior within the LDPE, and the breakdown voltage was predicted by incorporating the molecular displacement model. This analysis was conducted for a wide range of ramp rates from 10 to 1500 V/s. The current density was calculated using two different methods, namely the energy and average methods, and the results were compared with each other. The results of the numerical model were further verified by comparing with those from experiments reported in the literature.

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“…Based on the work of Raju et al (14) , it was assumed that the probability of failure can be estimated using Weibull distribution function, several measurements were required for applying the statistical method to each sample. In Statistics, the use of the Weibull distribution is a reliable method to determine the probability of failure of materials due to electrical stresses.…”

Section: Results and Discussion Surface Breakdown Strength (Sbs)mentioning

confidence: 99%

Effect of nitrogen plasma immersion ion implantation on surface electrical breakdown strength of the aluminized polyimide

Marcondes

Ueda²,

Rossi³

2018

RBAV

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To date, there are relatively few studies on polymer applications in space, especially those related to the evaluation of the dielectric breakdown resistance in the space environment. Polyimide (Kapton TM ) is extensively used in space in the thermal control of satellites but as a soft material subject to the aggressive space environment, it experiences degradation of properties during its lifetime. One property commonly affected in space is the surface electrical breakdown strength. The accumulation of charges on the surface of the Kapton occurs due to the formation of low-density hot plasma around the surface and due to the bombardment by highly energetic charged particles from space. The accumulation of charges can lead to deleterious electrical discharge on the surface of the material. In this study, aluminized Kapton, in the form of a film, has been treated by nitrogen plasma immersion ion implantation (PIII) inside a metallic tube. Mesh assisted and non-mesh assisted PIII have been tested. The influence of the ion implantation on the surface electrical breakdown strength of the treated samples has been determined using Weibull probability distribution function. The morphology of treated samples has been characterized by Atomic Force Microscopy. Results of the PIII treatment on morphology and surface electrical breakdown strength of Kapton are presented and discussed in this paper.

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Breakdown voltages of polymers in the temperature range 23°-250°C

Cited by 35 publications

References 6 publications

Effect of Film Thickness and Electrode Area on the Dielectric Breakdown Characteristics of Metallized Capacitor Films

Effect of Film Thickness and Electrode Area on the Dielectric Breakdown Characteristics of Metallized Capacitor Films

Finite Element Analysis of the Breakdown Prediction for LDPE Stressed by Various Ramp Rates of DC Voltage Based on Molecular Displacement Model

Effect of nitrogen plasma immersion ion implantation on surface electrical breakdown strength of the aluminized polyimide

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