1993
DOI: 10.1017/s0885715600019497
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Book Reviews - The Rietveld Method, R. A. Young, Editor, IUCr Monographs in Crystallography, 5, International Union of Crystallography, Oxford University Press, New York, NY, pp. 298. - The Rietveld Method, R. A. Young, Editor, Oxford University Press, Oxford, England1993. ISBN 0198555776, x + 298 pp., 87 figures, 32 tables - Metal & Alloys Indexes, International Centre for Diffraction Data, Swarthmore, PA, $5.00.

Abstract: The scientific programme will include invited lectures, microsymposia, and poster sessions. The first circular lists 19 main topics of the conference.

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Cited by 41 publications
(18 citation statements)
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“…An analysis of the XRD spectra made it possible to obtain numerical values and determine the phase ratio in the samples (Table .). The phase composition of the FC, NH3, EA, DEA, and Pyr samples (weight fractions of phases, C, wt %) was determined as the result of full profile Rietveld refinements of crystal structures , using the obtained XRD patterns. The precision of phase composition determination for this method is ±2–3 relative %.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…An analysis of the XRD spectra made it possible to obtain numerical values and determine the phase ratio in the samples (Table .). The phase composition of the FC, NH3, EA, DEA, and Pyr samples (weight fractions of phases, C, wt %) was determined as the result of full profile Rietveld refinements of crystal structures , using the obtained XRD patterns. The precision of phase composition determination for this method is ±2–3 relative %.…”
Section: Resultsmentioning
confidence: 99%
“…The search for the corresponding phases in the samples was carried out using the PDF-4+ (powder diffraction file) database of the ICDD (International Center for Diffraction Data), which includes more than 300,000 articles. The phase composition of samples was determined as the result of full-profile Rietveld refinements of crystal structures , using the obtained XRD patterns. The precision of phase composition determination for this method is ±2–3 relative %.…”
Section: Methodsmentioning
confidence: 99%
“…In the Rietveld refinement, the background was fit using a 20-term Chebyshev polynomial; the peaks were fitted using the modified Thompson–Cox–Hastings pseudo-Voigt function with anisotropic peak profiles adjusted using a six-term spherical harmonics Figure shows the final Rietveld refinement plots.…”
Section: Resultsmentioning
confidence: 99%
“…Crystal structure of the materials was evaluated by X-ray diffraction (XRD) in Bragg-Brentano geometry using a Philips X-Pert diffractometer; the patterns were acquired with 40 kV and 30 mA, using Cu K (=0.15418 nm) radiation and the scanning angle 2 varied between 20° and 80°, with 0.015° step. Lattice parameters, crystallite sizes, micro strain and preferential growth orientation were obtained through the Rietveld refinement method [27]. The refinement of XRD patterns were performed through the free software Fullprof, the criteria and sequence of refinement was achieved following the method proposed by Fuentes [28].…”
Section: Methodsmentioning
confidence: 99%