2020 IEEE Sixth International Conference on Big Data Computing Service and Applications (BigDataService) 2020
DOI: 10.1109/bigdataservice49289.2020.00024
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BoboCEP: Distributed Complex Event Processing for Resilient Fault-Tolerance Support in IoT

Abstract: Providing effective fault-tolerance (FT) support for Internet of Things (IoT) systems is hampered by the many ad hoc ways that it is implemented. We propose BoboCEP, a Complex Event Processing (CEP) system that provides resilient FT support for IoT systems, where errors are defined as nondeterministic finite automata. BoboCEP is designed to be distributed at the network edge, which facilitates resilient event processing and load balancing due to the active replication of FT support across the edge. We evaluate… Show more

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Cited by 4 publications
(2 citation statements)
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References 13 publications
(15 reference statements)
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“…BoboCEP has existed for several years as a CEP engine to provide inferential reasoning and decision-making on streaming data (Power & Kotonya, 2020) and has been under significant development ever since to become a robust platform on which to deploy IoT systems. It adopts an information flow processing (IFP) architecture that consumes a data stream from diverse sources (i.e., Things) (Cugola & Margara, 2012).…”
Section: Statement Of Needmentioning
confidence: 99%
“…BoboCEP has existed for several years as a CEP engine to provide inferential reasoning and decision-making on streaming data (Power & Kotonya, 2020) and has been under significant development ever since to become a robust platform on which to deploy IoT systems. It adopts an information flow processing (IFP) architecture that consumes a data stream from diverse sources (i.e., Things) (Cugola & Margara, 2012).…”
Section: Statement Of Needmentioning
confidence: 99%
“…Small devices tend to fail, inducing different faults, sometimes rendering the entire IoT system non-operational and producing unpredictable behaviour. The faults that are generally induced in the IoT system include Cascading faults [14,15], Pattern faults [16], and device-to-device communication faults [17]. Various faults occurring within the devices have been reviewed by Norris et al, [18,19].…”
Section: Introductionmentioning
confidence: 99%