In this study, zircon inclusions in selected 115 unheated sapphires originating from metamorphic deposits were studied by confocal micro‐Raman spectroscopy. By comparing Raman features of zircon inclusions in gem‐quality sapphires from Myanmar, India (Kashmir), Sri Lanka, and Madagascar, it could be established that those of younger age (sapphires from Myanmar and India [Kashmir]) contain zircon inclusion which exhibit relatively low ʋ1 and ʋ3 band positions and also smaller FWHM (ʋ3) than those in the older sapphires from Sri Lanka and Madagascar. Binary plotting of ʋ1 versus ʋ3 frequencies (Figure 3) and ʋ3 wavenumber versus FWHM of the studied zircon inclusions provide a method to distinguish young sapphires formed during Alpine‐Himalayan orogeny (Kashmir, Myanmar) from those related to the Pan‐African orogeny (Sri Lanka, Madagascar). This study shows the potential of the non‐destructive method on zircon inclusions in sapphires to be used to distinguish their origin as a service to the commercial gem trade.