Black box model-based self healing solution for stuck-at-faults in combinational circuits

Abstract

The paper unveils a black box model-based self healing strategy to suppress the ill effects of stuck-at-faults occurring in combinational circuits. The primary theory endeavours to attach a sense of reliability in the performance of digital systems and makes them insensitive to the negative impact of faults present in the system. The proposed methodology employs a dynamic fault tolerant approach to protect digital systems from the incursion of stuck-at-faults and enables the system to come up with fault free outputs. The simulation results affi rm the authenticity of the proposed strategy to cancel out the infl uence of faults and facilitate the system to heal itself. The work utilizes the attributes of an FPGA to demonstrate the practical viability of the proposed approach. The performance analysis endorses the defi nite dominance of the proposed healing scheme over the traditional Triple Modular Redundancy [TMR] in terms of fault coverage and area overhead.