Abstract:We presented nine new black box delay fault models for non-scan sequential circuits at the functional level, when the primary inputs and primary outputs are available only. We examined the suggested fault models in two stages. During the first stage of the experiment, we selected the best two fault models for further examination on the base of criterion proposed in the paper. During the second stage, we used the functional delay fault model and two black box delay fault models from the first stage for test sel… Show more
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