Ultrahigh molecular weight polyethylene (UHMWPE) is injection molded under high
pressure and studied by ultra-small-angle X-ray scattering (USAXS) during melting in a time-resolved
synchrotron radiation experiment. Results concerning melting and recrystallization of crystalline lamellae
are compared to data obtained by differential scanning calorimetry (DSC). USAXS analysis reveals a
coupled process of melting and crystallization which is not accompanied by external heat flow. Nine
isotropic samples differing in molecular weight and molding pressure are heated at a rate of 5 °C/min.
2D USAXS images integrate over temperature intervals between 3 and 7 °C. The materials are considered
two-phase semicrystalline polymers. Scattering curves obtained by azimuthal averaging are transformed
to interface distribution functions (IDF) which are perfectly fitted by a nanostructural model comprising
an ensemble of thick, uncorrelated layers (50 nm thickness) and stacks of short-range correlated crystalline
lamellae (20 nm). Crystalline layers are identified from their narrower layer thickness distribution and
their melting behavior. After the scattering effect of amorphous layers is eliminated, a composite crystallite
thickness distribution is obtained. Its variation is studied as a function of temperature, molecular mass
and molding pressure. In DSC thermograms samples prepared at high pressure exhibit a single strong
melting peak, whereas the other samples show an additional melting peak at lower temperature. This
might lead to the conclusion that the high-pressure samples predominantly contain extended chain
crystals. USAXS shows that high-pressure materials contain considerable amounts of imperfect thin crystal
lamellae that melt at lower temperature, while thick lamellae are formed. With low-pressure samples,
this coupled process of nanostructure transformation during annealing is found to be negligible.