BL-02: a versatile X-ray scattering and diffraction beamline for engineering applications at Indus-2 synchrotron source

Abstract

A hard X-ray engineering applications beamline (BL-02) was commissioned recently and started operation in March 2019 at the Indian synchrotron source, Indus-2. This bending-magnet-based beamline is capable of operating in various beam modes, viz. white, pink and monochromatic beam. The beamline utilizes the X-ray diffraction technique in energy-dispersive and angle-dispersive modes to carry out experiments mainly focused on engineering problems, viz. stress measurement, texture measurement and determination of elastic constants in a variety of bulk as well as thin-film samples. An open-cradle six-circle diffractometer with ∼12 kg load capacity allows accommodation of a wide variety of engineering samples and qualifies the beamline as a unique facility at Indus-2. The high-resolution mode of this beamline is suitably designed so as to carry out line profile analysis for characterization of micro- and nano-structures. In the present article the beamline is described starting from the beamline design, layout, optics involved, various operational modes and experimental stations. Experiments executed to validate the beamline design parameters and to demonstrate the capabilities of the beamline are also described. The future facilities to be incorporated to enhance the capabilities of the beamline are also discussed.

Interfacial interaction driven enhancement in the colossal magnetoresistance property of ultra-thin heterostructure of Pr0.6Sr0.4MnO3 in proximity with Pr0.5Ca0.5MnO3

“…Further, the heterostructure was annealed at 840 °C for 24 h in air. The structural characterization of the grown heterostructural film was performed in the Engineering applications beamline (BL-2), Indus-2 Synchrotron facility, RRCAT, Indore (India) 42 . X-rays of wavelength 0.826 Å were utilised for the θ−2θ powder X-ray diffraction (XRD), grazing-incidence X-ray diffraction (GI-XRD), and high-resolution X-ray diffraction (HR-XRD) measurements.…”

Anisotropic magnetic and magnetotransport properties in morphologically distinct Nd0.6Sr0.4MnO3 thin films

“…The surface morphology of the films was determined using scanning electron microscopy from the Carl Zeiss crossbeam 340 microscope. X-ray diffraction was carried out at engineering applications Beamline, BL-02, Indus-2 synchrotron source, India using a beam energy of 15 keV for the structural characterization of the films [21]. The monochromatic high-resolution mode of the beamline was used, keeping the beam energy at 15 keV (λ = 0.826 Å).…”

Structural characterization of Au/Cr bilayer thin films using combined X‐ray reflectivity and grazing incidence X‐ray fluorescence measurements

“…The details of the GIXRD experimental setup are described elsewhere. 15 The surface topography of the Au layer was examined using the AFM (Solver-Pro, NT-MDT) measurements in noncontact mode. During the AFM investigation, a sample was scanned over a surface area of $2 Â 2 μm 2 , using a silicon cantilever.…”

“…In all cases, the diffraction pattern was recorded using the MYTHEN2 X 1K detector in the line scan mode. The details of the GIXRD experimental setup are described elsewhere 15 . The surface topography of the Au layer was examined using the AFM (Solver‐Pro, NT‐MDT) measurements in noncontact mode.…”