2023 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM) 2023
DOI: 10.1109/aim46323.2023.10196194
|View full text |Cite
|
Sign up to set email alerts
|

BiSPD-YOLO: Surface Defect Detection Method for Small Features and Low-resolution Images

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2024
2024
2024
2024

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 15 publications
0
1
0
Order By: Relevance
“…Compared to convolution with a stride of 1, YOLOv8's downsampling operation reduces the utilization of some features, which mainly exists in the computation when the convolution kernel wraps to the next line. To address this issue, we propose adding SPD convolution [10] as the downsampling module and changing the cross-row convolution in YOLOv8 to non-cross-row convolution. Figure 2 depicts the principle of SPD convolution.…”
Section: Spd Convolution Computationmentioning
confidence: 99%
“…Compared to convolution with a stride of 1, YOLOv8's downsampling operation reduces the utilization of some features, which mainly exists in the computation when the convolution kernel wraps to the next line. To address this issue, we propose adding SPD convolution [10] as the downsampling module and changing the cross-row convolution in YOLOv8 to non-cross-row convolution. Figure 2 depicts the principle of SPD convolution.…”
Section: Spd Convolution Computationmentioning
confidence: 99%