Bismuth layer properties in the ultrathin Bi-FeNi multilayer films probed by spectroscopic ellipsometry
N. N. Kovaleva,
D. Chvostova,
O. Pacherova
et al.
Abstract:Using wide-band (0.5-6.5 eV) spectroscopic ellipsometry we study ultrathin [Bi(0.6-2.5 nm)-FeNi(0.8,1.2 nm)]N multilayer films grown by rf sputtering deposition, where the FeNi layer has a nanoisland structure and its morphology and magnetic properties change with decreasing the nominal layer thickness. From the multilayer model simulations of the ellipsometric angles, Ψ(ω) and ∆(ω), the complex (pseudo)dielectric function spectra of the Bi layer were extracted. The obtained results demonstrate that the Bi lay… Show more
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