BIPM direct on-site Josephson voltage standard comparisons: 20 years of results

Solve, S; Stöck, M

doi:10.1088/0957-0233/23/12/124001

Cited by 9 publications

(6 citation statements)

References 42 publications

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“…For series 1-11, the two stages were present. It is well known that the insulation resistance of the capacitance of the filters can be an issue [19], with two stages of LC filters, I L = 2 × U/R L , where U is the PJVS output voltage and R L is the insulation resistance of the capacitance ( figure 5). In the case of direct comparison with the two stages of filters, the voltage difference between the two PJVS was directly affected by I L and the wiring resistance r m1 : U(BIPM) − U(NMIJ) = e, where e = 4 × U × r m1 /R L .…”

Section: Leakage Current Errorsmentioning

confidence: 99%

“…Relative agreement between the current BIPM traveling CJVS system [19] and the new traveling PJVS system has already achieved a relative type A uncertainty of 8 parts in 10 12 when measured at 10 V. Such direct comparisons are organized on a regular basis in the BIPM laboratories as a requirement of the BIPM quality management system, in order to support the stated measurement uncertainty as well as the capabilities of the quantum voltage transfer standard and associated measurement setup used in on-site direct compariso ns with NMIs [20].…”

Section: Introductionmentioning

confidence: 99%

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Direct DC 10 V comparison between two programmable Josephson voltage standards made of niobium nitride (NbN)-based and niobium (Nb)-based Josephson junctions

et al. 2018

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BIPM's new transportable programmable Josephson voltage standard (PJVS) has been used for an on-site comparison at the National Metrology Institute of Japan (NMIJ) and the National Institute of Advanced Industrial Science and Technology (AIST) (NMIJ/AIST, hereafter called just NMIJ unless otherwise noted). This is the first time that an array of niobium-based Josephson junctions with amorphous niobium silicon Nb x Si 1−x barriers, developed by the National Institute of Standards and Technology 4 (NIST), has been directly compared to an array of niobium nitride (NbN)-based junctions (developed by the NMIJ in collaboration with the Nanoelectronics Research Institute (NeRI), AIST). Nominally identical voltages produced by both systems agreed within 5 parts in 10 12 (0.05 nV at 10 V) with a combined relative uncertainty of 7.9 × 10 −11 (0.79 nV). The low side of the NMIJ apparatus is, by design, referred to the ground potential. An analysis of the systematic errors due to the leakage current to ground was conducted for this ground configuration. The influence of a multi-stage low-pass filter installed at the output measurement leads of the NMIJ primary standard was also investigated. The number of capacitances in parallel in the filter and their insulation resistance have a direct impact on the amplitude of the systematic voltage error introduced by the leakage current, even if the current does not necessarily return to ground. The filtering of the output of the PJVS voltage leads has the positive consequence of protecting the array from external sources of noise. Current noise, when coupled to the array, reduces the width or current range of the quantized voltage steps. The voltage error induced by the leakage current in the filter is an order of magnitude larger than the voltage error in the absence of all filtering, even though the current range of steps is significantly decreased without filtering. Bureau International des Poids et Mesures 4 Contribution of the US Government, not subject to copyright.

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Section: Leakage Current Errorsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Direct DC 10 V comparison between two programmable Josephson voltage standards made of niobium nitride (NbN)-based and niobium (Nb)-based Josephson junctions

et al. 2018

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“…The basic principle of our approach is based on summing the outputs of the CWD and PD JJAs. The methods for the evaluation of the CWD JJAs are well known (see for example [2]). The evaluation of our combined system was performed in two stages.…”

Section: System Evaluationmentioning

confidence: 99%

“…PJVSs contain a number of sub-JJAs, with each sub-JJA containing a number of Josephson junctions (JJs). The number of the JJs per sub-JJA is chosen in such a way to produce a number of predetermined voltages [2,6,[8][9][10]. For practical devices, the minimum voltage that a CWD JJAs can generate is limited to the voltage across one junction, typically 5 µV-155 µV, depending on the RF bias frequency.…”

Section: Introductionmentioning

confidence: 99%

Quasi-continuous dc voltage standard using sinusoidal and pulse-driven Josephson junction arrays

Georgakopoulos¹,

Budovsky²,

Benz³

2022

Meas. Sci. Technol.

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Josephson voltage standards (JVSs) provide a primary realization of the volt, the unit of electromotive force. They generate direct (dc) voltages up to 10 V and show agreement better than 1 nV/V at 10 V. For JVSs based on Josephson junction arrays (JJAs) that are driven by sinusoidal radiofrequency (RF) power, commonly referred to as continuous wave-driven JJAs (CWD JJAs), the minimum voltage that can be generated is limited to the voltage across one Josephson junction for practical devices. To achieve this resolution, they may require a perfect JJA chip. JVSs based on a pulse-driven (PD) JJA require high performance electronics (i.e., high bandwidth, low distortion and jitter, pulse shaping filters and large memory) to achieve their minimum and maximum voltage. We have combined two CWD JJAs and two PD JJAs driven by two microwave inputs to one chip to generate quasi-continuous dc voltages up to the sum of the full-scale voltages of both JJAs that are robust to the imperfections of the Josephson junctions and have relaxed requirements on the radio frequency (RF) electronics driving the JJA, compared to the existing CWD JVSs and PD JVSs, respectively. By use of the JJA chip at the National Measurement Institute Australia, we demonstrate its feasibility to generate voltages up to 1 V. Preliminary evaluation of the system shows that the voltage uncertainty can be 11 nV (k=2) or better and the theoretical resolution is better than 1 nV from 0 V to 1 V. The main requirement is that all the Josephson junctions must have quantum locking ranges with respect to the power and frequency of the RF bias and for the PD JJAs to have a constant voltage over a range of dc bias current. Although this development is not a replacement for existing state-of-the-art JVSs, we anticipate that it will be an alternative fit-for-purpose solution for metrological applications under non-ideal operating conditions or when the components of the state-of-the-art solutions are not available.

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“…The last investigation is based on a direct JVS comparison setup, where the first primary voltage standard is the BIPM CJVS transportable system [5]. This system is directly compared at 10 V to the NIST PJVS.…”

Section: Line Resistance Insertion In a Direct Comparisonmentioning

confidence: 99%

The leakage resistance to ground of a NIST Programmable Josephson Voltage Standard

Solve

Chayramy

Rüfenacht

et al. 2014

29th Conference on Precision Electromagnetic Measurements (CPEM 2014)

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The Programmable Josephson Voltage Standard (PJVS) leakage resistance to ground (LRG) is defined as the electrical resistance of one side of the measurement leads to ground. Under certain measurement conditions, this resistance can produce a significant systematic voltage error of the measured value of the PJVS output voltage. In particular, if the low side of the array is grounded, for instance in a direct comparison measurement with another JVS, then the LRG will reduce the PJVS output voltage. At 10 V, an error of 0.5 nV can result from a LRG of 50 GΩ Ω Ω Ω if the measurement leads have a total resistance of 2.5 Ω Ω Ω Ω. The LRG and the path of the leakage current to ground are difficult to determine. Furthermore, its corresponding voltage error is still present while the bias source is in operation to control the PJVS. It is therefore important to apply different measurement techniques to compare the corresponding LRG values.

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BIPM direct on-site Josephson voltage standard comparisons: 20 years of results

Cited by 9 publications

References 42 publications

Direct DC 10 V comparison between two programmable Josephson voltage standards made of niobium nitride (NbN)-based and niobium (Nb)-based Josephson junctions

Direct DC 10 V comparison between two programmable Josephson voltage standards made of niobium nitride (NbN)-based and niobium (Nb)-based Josephson junctions

Quasi-continuous dc voltage standard using sinusoidal and pulse-driven Josephson junction arrays

The leakage resistance to ground of a NIST Programmable Josephson Voltage Standard

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