2015
DOI: 10.1088/1367-2630/17/8/083058
|View full text |Cite
|
Sign up to set email alerts
|

Bifunctional effects of the ordered Si atoms intercalated between quasi-free-standing epitaxial graphene and SiC(0001): graphene doping and substrate band bending

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

5
11
0

Year Published

2016
2016
2024
2024

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 10 publications
(16 citation statements)
references
References 71 publications
5
11
0
Order By: Relevance
“…[ 24 ] Relating the change in the intensity of the SiC peak (i.e., B C to B C ″ ) in the C 1s spectrum, to the magnitude of intercalation is not a new analysis technique, and various examples can be found in literature. [ 31,42,75,76 ] Thus, we expect that as the sample becomes more intercalated, component B C should diminish in photoemission intensity, and at the same time, component B C ″ (located at lower binding energy) should increase in photoemission intensity relative to the graphene peak at 284.83 ± 0.05 eV (labeled as “G” in Figure 4a,b, see the Supporting Information for further details on the graphene fitting procedure). That is, B c and B C ″ should possess an inverse relationship of the form: normalBnormalCn+ boldnormalBCn=normalB0 …”
Section: Resultsmentioning
confidence: 99%
“…[ 24 ] Relating the change in the intensity of the SiC peak (i.e., B C to B C ″ ) in the C 1s spectrum, to the magnitude of intercalation is not a new analysis technique, and various examples can be found in literature. [ 31,42,75,76 ] Thus, we expect that as the sample becomes more intercalated, component B C should diminish in photoemission intensity, and at the same time, component B C ″ (located at lower binding energy) should increase in photoemission intensity relative to the graphene peak at 284.83 ± 0.05 eV (labeled as “G” in Figure 4a,b, see the Supporting Information for further details on the graphene fitting procedure). That is, B c and B C ″ should possess an inverse relationship of the form: normalBnormalCn+ boldnormalBCn=normalB0 …”
Section: Resultsmentioning
confidence: 99%
“…Pristine EMLG shows two major components: BSi (EB = 101.47 ± 0.05 eV) corresponds to "bulk" SiC, 7,[32][33] and ZSi (EB = 101.83 ± 0.05 eV) to surface Si bonded to the C in the buffer layer/zero layer. 7,29,34 (The components corresponding to compounds present in both the Si 2p and C 1s XPS spectra are designated using the same label, with different subscript labels, in order to distinguish the specific core level, i.e., BSi and BC are the bulk SiC signals in the Si 2p and C 1s spectra, respectively). The corresponding atomic positions are shown schematically in the insets in Figs.…”
Section: X-ray Photoelectron Spectroscopy Of Ca-qfsblgmentioning
confidence: 99%
“…[35][36] This is strong evidence for a Ca-Si bonding environment at the SiC surface underneath the graphene and buffer layer and is in contrast with previous reports that Ca intercalates between the graphene layers, 12,19 or between the buffer layer and the 1 st graphene layer. 8,20 In fact, many reports have been made on the intercalation of alkalis, [37][38][39] transition metals, 31,[40][41] rare earths [9][10]42 and others elements 34,[43][44][45] underneath the buffer layer (see ref. 46 for a brief review of intercalation of graphene on SiC).…”
Section: X-ray Photoelectron Spectroscopy Of Ca-qfsblgmentioning
confidence: 99%
“…Intercalation of many species such as H, O, F, Au, Li, Na, Ge, Si and Yb [13][14][15][16][17][18][19][20][21][22] varied graphene doping in a wide range from n-doped to p-doped materials. Si and Ge, both from group IV, can be intercalated and effectively decouple the buffer layer from its supporting SiC substrate [19,20,23,24]. Si atoms can form two ordered structures at the interface depending on the annealing temperature, and the more ordered one obtained at higher temperature passivates the substrate more effectively with less electron doping [23].…”
Section: Introductionmentioning
confidence: 99%
“…Si and Ge, both from group IV, can be intercalated and effectively decouple the buffer layer from its supporting SiC substrate [19,20,23,24]. Si atoms can form two ordered structures at the interface depending on the annealing temperature, and the more ordered one obtained at higher temperature passivates the substrate more effectively with less electron doping [23]. Ge, similar to Au [16], produces ambipolar doping depending on the amount of intercalated atoms [19,24].…”
Section: Introductionmentioning
confidence: 99%