2006
DOI: 10.1016/j.tsf.2005.11.099
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Bifacial heterojunction silicon solar cells by hot-wire CVD with open-circuit voltages exceeding 600 mV

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Cited by 22 publications
(9 citation statements)
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“…thickness 300 mm with aluminum back-surface-field (Al-BSF), following a method described elsewhere. The inner structure of the studied solar cells was indium tin oxide (ITO)/(n)a-Si:H/(i)a-Si:H/(p)c-Si/Al, with all the films deposited by hot-wire chemical vapor deposition technique [11]. The thickness of the intrinsic passivation a-Si:H layer was 5 nm.…”
Section: Resultsmentioning
confidence: 99%
“…thickness 300 mm with aluminum back-surface-field (Al-BSF), following a method described elsewhere. The inner structure of the studied solar cells was indium tin oxide (ITO)/(n)a-Si:H/(i)a-Si:H/(p)c-Si/Al, with all the films deposited by hot-wire chemical vapor deposition technique [11]. The thickness of the intrinsic passivation a-Si:H layer was 5 nm.…”
Section: Resultsmentioning
confidence: 99%
“…The low processing temperature (o200 1C) prevents the bulk property degradation of the substrate that is usually observed in high-temperature processes. Further, compared with the conventional diffused solar cells, HIT solar cells have a better temperature coefficient and a higher open-circuit voltage (V OC ) [2][3][4]. For these reasons, HIT solar cells have been extensively investigated.…”
Section: Introductionmentioning
confidence: 99%
“…With regard to the back contact, the lattice constant for the case at hand is roughly 375 nm implying that the benefits of coupling light into planar resonant modes is essentially lost once the TCO thickness has reached $90 nm, a typical thickness of indium tin oxide layer in amorphouscrystalline silicon heterojunction solar cells. [28] Thus, the benefits of the PC back-reflector would not be fully realized if a TCO film were to be inserted between the wafer and the PC. An alternative approach to implementing the PC backreflector may be to structure the back contact itself in the form of a PC.…”
Section: Incorporating Pc Back-reflectors Into Si Pv Devicesmentioning
confidence: 99%