2016
DOI: 10.1063/1.4959109
|View full text |Cite
|
Sign up to set email alerts
|

Biasing vector network analyzers using variable frequency and amplitude signals

Abstract: We report the development of a test setup designed to provide a variable frequency biasing signal to a vector network analyzer (VNA). The test setup is currently used for the testing of liquid crystal (LC) based devices in the microwave region. The use of an AC bias for LC based devices minimizes the negative effects associated with ionic impurities in the media encountered with DC biasing. The test setup utilizes bias tees on the VNA test station to inject the bias signal. The square wave biasing signal is va… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2017
2017
2020
2020

Publication Types

Select...
3

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(1 citation statement)
references
References 9 publications
0
1
0
Order By: Relevance
“…It is designed to sustain the characteristic impedance over a wide bandwidth in the transition from CPW to microstrip. The top and bottom‐layer ground planes have cut‐outs (in the shape of an exponential curve) which are designed to smooth out the electric field distribution of the electromagnetic wave propagating along the planar structures . Such design transitions are necessary to optimize the power transfer of the signals through the filter structure.…”
Section: Device Fabrication and Characterizationmentioning
confidence: 99%
“…It is designed to sustain the characteristic impedance over a wide bandwidth in the transition from CPW to microstrip. The top and bottom‐layer ground planes have cut‐outs (in the shape of an exponential curve) which are designed to smooth out the electric field distribution of the electromagnetic wave propagating along the planar structures . Such design transitions are necessary to optimize the power transfer of the signals through the filter structure.…”
Section: Device Fabrication and Characterizationmentioning
confidence: 99%