Bias PUF based Secure Scan Chain Design

Li, Wenjie; Ye, Jing; Li, Xiaowei; Li, Huawei; Hu, Yu

doi:10.1109/asianhost.2018.8607168

Cited by 7 publications

(2 citation statements)

References 15 publications

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“…V. DISCUSSION AND CONCLUSION Among the scan locking solutions that follow the same threat model used in logic locking, the only defenses that our attack cannot circumvent are those that incorporate cryptographic functions [7], [8] or PUF structures [19] to generate dynamic keys. Our attack cannot model such modules into their combinational logic equivalent.…”

Section: Resultsmentioning

confidence: 99%

DynUnlock: Unlocking Scan Chains Obfuscated using Dynamic Keys

Limaye

Sinanoglu

2020

2020 Design, Automation &Amp; Test in Europe Conference &Amp; Exhibition (DATE)

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Outsourcing in semiconductor industry opened up venues for faster and cost-effective chip manufacturing. However, this also introduced untrusted entities with malicious intent, to steal intellectual property (IP), overproduce the circuits, insert hardware Trojans, or counterfeit the chips. Recently, a defense is proposed to obfuscate the scan access based on a dynamic key that is initially generated from a secret key but changes in every clock cycle. This defense can be considered as the most rigorous defense among all the scan locking techniques. In this paper, we propose an attack that remodels this defense into one that can be broken by the SAT attack, while we also note that our attack can be adjusted to break other less rigorous (key that is updated less frequently) scan locking techniques as well.

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Section: Resultsmentioning

confidence: 99%

DynUnlock: Unlocking Scan Chains Obfuscated using Dynamic Keys

Limaye

Sinanoglu

2020

2020 Design, Automation &Amp; Test in Europe Conference &Amp; Exhibition (DATE)

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“…In [49], a Bias PUF based secure scan design is proposed. The main idea of this design is to mask input and output data of the scan chain when unauthorized user uses it.…”

Section: J Bias Puf Based Scanmentioning

confidence: 99%

Scan Chain Based Attacks and Countermeasures: A Survey

et al. 2019

IEEE Access

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Scan chains increase the testability but decrease security. Attackers may use scan chains to launch attacks to obtain sensitive information, which poses serious security threats. The scan chain-based attacks contain two steps: 1) scan data obtaining, including mode switching obtaining method and test mode only obtaining method, and 2) scan data analysis, including data mapping analysis method and signature analysis method. To prevent these attacks, various secure scan designs have been proposed. These designs are summarized into two categories: scan chain modification and scan input/output restriction. This paper gives a survey of the scan chain-based attacks and countermeasures. The secure scan designs are summarized and compared from the aspects of security, testability, test time, and hardware overhead.INDEX TERMS Scan chain based attacks, test mode, mode switch, signature, secure scan chain, secret key, physical unclonable function.

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Adjustable Arbiter Physical Unclonable Function with Flexible Response Distribution

et al. 2019

2019 China Semiconductor Technology International Conference (CSTIC)

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Bias PUF based Secure Scan Chain Design

Cited by 7 publications

References 15 publications

DynUnlock: Unlocking Scan Chains Obfuscated using Dynamic Keys

DynUnlock: Unlocking Scan Chains Obfuscated using Dynamic Keys

Scan Chain Based Attacks and Countermeasures: A Survey

Adjustable Arbiter Physical Unclonable Function with Flexible Response Distribution

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