2023
DOI: 10.1007/s10948-023-06545-0
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Bias-Field-Free Microwave Operation in NiFe/FeMn Exchange Biased Bilayers by Varying FeMn Thickness

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Cited by 5 publications
(3 citation statements)
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“…Here, we would like to mention that the shift we have observed in these stacks can be attributed to the collective impact of the Ta/NiFe seed layer and the oblique deposition process used in the deposition to facilitate the growth of the γ-fcc FeMn phase at the room temperature. We have already reported a similar shift in the NiFe/FeMn bilayers in our earlier work [23,24]. Further, a two-step reversal M-H loop was observed for higher FeMn thickness i.e.…”
Section: Methodssupporting
confidence: 79%
See 1 more Smart Citation
“…Here, we would like to mention that the shift we have observed in these stacks can be attributed to the collective impact of the Ta/NiFe seed layer and the oblique deposition process used in the deposition to facilitate the growth of the γ-fcc FeMn phase at the room temperature. We have already reported a similar shift in the NiFe/FeMn bilayers in our earlier work [23,24]. Further, a two-step reversal M-H loop was observed for higher FeMn thickness i.e.…”
Section: Methodssupporting
confidence: 79%
“…Special interest has been devoted to NiFe/FeMn bilayers and NiFe/FeMn/NiFe trilayer system for their compatibility of the read operation with the state-of-the-art electronic platform [18][19][20][21][22]. In our earlier studies, we demonstrated the zero-field resonance mode in NiFe/FeMn bilayers and explored the importance of a biasfield-free system for microwave devices [23,24]. Similarly, NiFe/FeMn/NiFe tri-layer system showed two distinct resonance peaks in in-plane and out-of-plane ferromagnetic resonance (FMR) spectra which were attributed to the two NiFe layers, respectively [25].…”
Section: Introductionmentioning
confidence: 99%
“…It is very critical to manipulate the formation of planar defects APBs in a controllable and reliable manner for the novel device applications [22][23][24]. Previous studies on the exchange bias effect have mostly focused on alloy and perovskite heterojunctions [25][26][27][28][29]. However, the microstructural properties related to exchange bias effect in bilayer spinel oxide heterojunctions has been rarely reported.…”
Section: Introductionmentioning
confidence: 99%