High quality epitaxial layers of GaAs, InP, AIAs, InGaAs, InGaP, InGaAIP have been grown by low-pressure metalorganic chemical vapor deposition using TMIn, TMGa, TMAI and the less hazardous group V precursors, ΤΒΑ, TBP. Excellent morphology was obtained for GaAs and InP in the temperature ranges of 570-650°C and 520-650°C, respectively. The V/III ratio as low as 1.5 was used to grow epilayers of InP. The 77 K mobility of InGaAs lattice matched to InP (grown with ΤΒΑ) was 72360 cm 2 /(V s) for n = 1.5 x 10 15 /cm -3 and a thickness of 2 gym. Comparable photoluminescence parameters of InGaP between layers grown with TBP and PH 3 were achieved, but for InGaAlP (TBP) photoluminescence intensity was significantly lower than for InGaAlP (PH3). The promising results allow one to apply of ΤΒΑ and TBP for developing of device structures.