2011
DOI: 10.1063/1.3546169
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Beyond the Nernst-limit with dual-gate ZnO ion-sensitive field-effect transistors

Abstract: Beyond the Nernst-limit with dual-gate ZnO ion-sensitive field-effect transistors Spijkman, M.; Smits, E. C. P.; Cillessen, J. F. M.; Biscarini, F.; Blom, P. W. M.; de Leeuw, D. M.

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Cited by 118 publications
(77 citation statements)
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“…The theoretical work provides a unifying framework to interpret a broad range of experimental data reported in the literature. [6][7][8][9] Rather surprisingly and somewhat counter-intuitively, we find that if both signal and noise can be measured with infinite precision, the best pH-resolution achieved by a DGFET sensor is indistinguishable from that of a single-gated sensor. On the other hand, if the minimum detectable pH change is determined by the noise associated with inexpensive instrumentation-as sometimes is the case for commercial systems-DGFETs will offer better signal to noise ratio and improved pH-resolution compared to classical counterparts.…”
Section: Introductionmentioning
confidence: 92%
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“…The theoretical work provides a unifying framework to interpret a broad range of experimental data reported in the literature. [6][7][8][9] Rather surprisingly and somewhat counter-intuitively, we find that if both signal and noise can be measured with infinite precision, the best pH-resolution achieved by a DGFET sensor is indistinguishable from that of a single-gated sensor. On the other hand, if the minimum detectable pH change is determined by the noise associated with inexpensive instrumentation-as sometimes is the case for commercial systems-DGFETs will offer better signal to noise ratio and improved pH-resolution compared to classical counterparts.…”
Section: Introductionmentioning
confidence: 92%
“…(3), and finally, (iv) the oxide-Si FET system described by Eqs. (4)- (8). The corresponding equations for noise are summarized in Table II, through Eqs.…”
Section: B Model Equationsmentioning
confidence: 99%
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