“…The exemplar patches can be generated from external datasets [10,2], the input image itself [11,9], or combined sources [44]. Various learning methods of the mapping functions have been proposed such as weighted average [31,2], kernel regression [17], support vector regression [23], Gaussian process regression [13], sparse dictionary representation [46,7,5,24,45,39,47,19,14]. In addition to equally averaging overlapped patches, several methods for blending overlapped pixels have been proposed including weighted averaging [11,44], Markov Random Fields [10], and Conditional Random Fields [38].…”