Benchmark Study on YOLOv8 Variants in Localized Multiclass Fault Detection in PCBs

Najib, Taeef; Muntasir, Fahim; Wasi, Wasif Al Wazed

doi:10.1109/iceeict62016.2024.10534448

2024 6th International Conference on Electrical Engineering and Information &Amp;amp; Communication Technology (ICEEICT) 2024

DOI: 10.1109/iceeict62016.2024.10534448

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Benchmark Study on YOLOv8 Variants in Localized Multiclass Fault Detection in PCBs

Taeef Najib,

Fahim Muntasir,

Wasif Al Wazed Wasi

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Benchmark Study on YOLOv8 Variants in Localized Multiclass Fault Detection in PCBs

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References 17 publications

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