1985
DOI: 10.1002/maco.19850360304
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Bedeutung der Dynamischen Systemanalyse für Korrosionsuntersuchungen in Forschung und Praxis

Abstract: Voraussetzung fur einen optimalen Werkstoffeinsatz in der Technik ist die Kenntnis des dynamischen Korrosionsverhaltens des Systems. Im ersten Teil dieser Arbeit werden die Grundlagen der dynamischen Systemanalyse und ihre charakteristischen KenngroRen dargestellt. Die verschiedenen Mefirnethoden und prinzipielle Probleme bei der Interpretation der McBergcbnissc werden diskutiert. Im zweitcn Teil werden fur einfache Korrosionssysteme verschiedene Auswerteverfahren behandelt. Im dritten Ted werden charakteristi… Show more

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Cited by 48 publications
(12 citation statements)
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“…To account for such behaviour, a model was proposed in which the double layer capacitance C dl is replaced by the constant phase element Q dl . The total impedance of such systems can be represented by the following transfer function [34].…”
Section: C Potentiostatic Impedance Resultsmentioning
confidence: 99%
“…To account for such behaviour, a model was proposed in which the double layer capacitance C dl is replaced by the constant phase element Q dl . The total impedance of such systems can be represented by the following transfer function [34].…”
Section: C Potentiostatic Impedance Resultsmentioning
confidence: 99%
“…[23] Jüttner et al also explained inductive behavior observed in the low frequency range of impedance spectra of pure iron in 0.5 M sulphuric acid by surface relaxation phenomena. [26] The EIS results of the two base alloys show that they exhibit strongly different corrosion behavior in the 0.5 molar NaCl solution. This should allow to discern the influence of the different base alloys on the corrosion properties of the nugget phases that are built during the FSW processes without or with US support.…”
Section: Eismentioning
confidence: 98%
“…This circuit consists of the resistance of solution (Rs) between the working electrode and the counter electrode, and the double-layer capacitance (C dl ) in parallel to the charge-transfer resistance (R ct ). Thus, this takes into account the deviation of the double layer behavior from the ideal capacitance due to surface in homogeneity (Jiittner et al, 1985). Also, very good fit to the equivalent circuit model was obtained as shown in Figure 8 in solid line.…”
Section: Electrochemical Methodsmentioning
confidence: 72%