Beamline I511 at MAX II, capabilities and performance

Denecke, R.; Väterlein, P.; Bäßler, M.; Wassdahl, N.; Butorin, Sergei M.; Nilsson, Anders; Rubensson, J.‐E.; Nordgren, Joseph; Mårtensson, Nils; Nyholm, R.

doi:10.1016/s0368-2048(98)00358-2

Cited by 146 publications

(100 citation statements)

References 9 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The contribution of Li 2s states to the valenceband spectrum, which would provide a direct proof of incomplete charge transfer, cannot be detected due to the much lower photoionization cross section 73,74 of the Li 2s orbital (by at least a factor of 10) with respect to carbon valence states over the whole photon energy range available on beamline I511. 31 The valence-band spectrum of our Li 4 C 60 films is very similar to that obtained by Schnadt et al on a Li-doped film of average stoichiometry x e 1. 29 In particular, the shape, relative intensity and binding energy of the two frontier features are practically identical.…”

Section: Mev)supporting

confidence: 86%

“…31 In both cases, the films were grown in situ in a base pressure lower than 4 × 10 -10 mbar and characterized at room temperature. Ordered C 60 films were obtained by depositing C 60 onto a metallic substrate in two steps, each followed by annealing, to form first an ordered monolayer and subsequently a multilayer film.…”

Section: Methodsmentioning

confidence: 99%

“…This substrate had a hole on one side into which a thermocouple was inserted. The beamline end station 31 is equipped with a Scienta R4000 hemispherical electron energy analyzer, which can be rotated around the beam of the incoming linearly polarized light. This allows changing the angle of detection of the photoelectrons without modifying the geometry of the sample with respect to the photon beam, which impinges always with s-polarization at grazing incident (7°tilt angle) with respect to the substrate.…”

Section: Methodsmentioning

confidence: 99%

See 2 more Smart Citations

Low Band Gap and Ionic Bonding with Charge Transfer Threshold in the Polymeric Lithium Fulleride Li₄C₆₀

Macovez¹,

Savage

Schiessling

et al. 2008

J. Phys. Chem. C

View full text Add to dashboard Cite

Low band gap and ionic bonding with charge transfer, threshold in the polymeric lithium fulleride Li(4)C(60) Macovez, Roberto; Savage, Rebecca; Schiessling, Joachim; Kamaras, Katalin; Rudolf, Petra; Venema, L.C. Take-down policy If you believe that this document breaches copyright please contact us providing details, and we will remove access to the work immediately and investigate your claim.Downloaded from the University of Groningen/UMCG research database (Pure): http://www.rug.nl/research/portal. For technical reasons the number of authors shown on this cover page is limited to 10 maximum. September 22, 2007; In Final Form: NoVember 19, 2007 We demonstrate the growth of crystalline Li 4 C 60 films. The low-energy electron diffraction pattern of the films indicates the formation of polymer chains in the plane of the surface, consistent with the reported crystal structure. Electron energy loss and photoemission spectra identify the Li 4 C 60 polymer as a low band gap semiconductor, with a relatively strong coupling of electrons to low-frequency stretching modes of the polymer bonds and alkali phonons. No evidence is found for hybridization between the Li-and fullerenederived electronic states. Instead, a partial charge transfer takes place, which is the same for different Li concentrations. This result rationalizes the stability of the polymer phase over a wide range of stoichiometries.

show abstract

Section: Mev)supporting

confidence: 86%

Section: Methodsmentioning

confidence: 99%

Section: Methodsmentioning

confidence: 99%

See 1 more Smart Citation

Low Band Gap and Ionic Bonding with Charge Transfer Threshold in the Polymeric Lithium Fulleride Li₄C₆₀

Macovez¹,

Savage

Schiessling

et al. 2008

J. Phys. Chem. C

View full text Add to dashboard Cite

show abstract

“…2.3 X-ray photoelectron spectroscopy X-ray photoemission spectroscopy (XPS) experiments were carried out with a Scienta R4000 analyser at beamline I511 of Max-lab in Lund [32], Sweden. For this purpose a few drops of suspension were cast onto gold film substrate.…”

Section: Photoluminescence Spectroscopymentioning

confidence: 99%

Soft X‐ray induced oxidation on acrylic acid grafted luminescent silicon quantum dots in ultrahigh vacuum

Chao

Wang

Pietzsch

et al. 2011

Physica Status Solidi (a)

View full text Add to dashboard Cite

Water soluble acrylic acid grafted luminescent silicon quantum dots (Si-QDs) were prepared by a simplified method. The resulting Si-QDs dissolved in water and showed stable strong luminescence with peaks at 436 and 604 nm. X-ray photoelectron spectroscopy (XPS) was employed to examine the surface electronic states after the synthesis. The co-existence of the Si2p and C1s core levels infers that the acrylic acid has been successfully grafted on the surface of silicon quantum dots. To fit the Si2p spectrum, four components were needed at 99.45, 100.28, 102.21 and 103.24 eV. The first component at 99.45 eV (I) was assigned to Si-Si within the silicon core of the Si-QDs. The second component at 100.28 eV (II) was from Si-C. The third at 102.21 eV (III) was a sub-oxide state and the fourth at 103.24 eV (IV) was from SiO 2 at Si-QDs surface. With an increase in exposure to soft X-ray photons, the intensity ratio of the two peaks within the Si2p region A and B increased from 0.5 to 1.4 while the peak A intensity decreased, and eventually a steady state was reached. This observation is explained in terms of photon-induced oxidation taking place within the surface dangling bonds. As the PL profile for Si-QDs is influenced by the degree of oxidation within the nanocrystal structure, the inducement of oxidation by soft X-rays will play a role in the range of potential applications where such materials could be used -especially within biomedical labelling.

show abstract

“…The SXE measurements were performed at the undulator beamline I511-3 at MAX II (MAX-lab National Laboratory, Lund University, Sweden), which includes a 49-pole undulator and a modified SX-700 plane grating monochromator [5]. The SXE spectra were recorded with a high-resolution Rowland-mount grazing-incidence grating spectrometer [6] with a twodimensional detector.…”

Section: Methodsmentioning

confidence: 99%

Max-Phases Investigated by Soft X-Ray Emission Spectroscopy

Magnuson

Mechanical Properties and Performance of Engineering Ceramics II: Ceramic Engineering and Science Proceedings, Volume 27, Issue

View full text Add to dashboard Cite

The electronic structures of the MAX-phases Ti 3 AlC 2 , Ti 3 SiC 2 and Ti 3 GeC 2 were investigated by soft X-ray emission spectroscopy. These nanolaminated carbide compounds represent a class of layered materials with a combination of properties from both metals and ceramics. The bulksensitive soft X-ray emission technique is shown to be particularly useful for detecting detailed electronic structure information about internal monolayers and interfaces. A weak covalent TiAl bond is manifested by a pronounced shoulder in the Ti L-emission of Ti 3 AlC 2 . When Al is replaced by Si or Ge, the shoulder disappears. Furthermore, the spectral shapes of Al, Si and Ge in the MAX-phases are strongly modified in comparison to the corresponding pure elements. By varying the constituting elements, a change of the electron population is achieved causing a change of covalent bonding between the laminated layers, which enables control of the macroscopic properties of the material. INTRODUCTIONIn the last few years, the interest in ternary carbides and nitrides, so-called M n+1 AX n -phases has grown significantly both from a scientific and a technological point of view [1]. Generally, there are three different kinds of crystal structures of these materials, often denoted 211, 312 and 413, corresponding to n=1, 2 and 3. The letter M denotes an early transition metal, A is an element in the groups IIIA and IVA and X is either carbon or nitrogen. The MAX-phases exhibit a unique combination of metallic and ceramic properties, including high strength and stiffness at high temperature, resistance to oxidation and thermal shock, and display high electrical and thermal conductivity [1]. The unique macroscopic properties of the MAX-phases are related to the underlying nanolaminated crystal structure, the electronic structure and the chemical bonding of the individual atomic layers. For the 312-crystal structure, there are three different carbides, Ti 3 AlC 2 , Ti 3 SiC 2 and Ti 3 GeC 2 . Sintered bulk MAX-compounds are useful in many technological high-temperature applications such as heating elements in ovens. In other applications where e.g., low-friction properties are useful, high-quality thin film coatings of MAX-phases are utilized.

show abstract

Beamline I511 at MAX II, capabilities and performance

Cited by 146 publications

References 9 publications

Low Band Gap and Ionic Bonding with Charge Transfer Threshold in the Polymeric Lithium Fulleride Li₄C₆₀

Low Band Gap and Ionic Bonding with Charge Transfer Threshold in the Polymeric Lithium Fulleride Li₄C₆₀

Soft X‐ray induced oxidation on acrylic acid grafted luminescent silicon quantum dots in ultrahigh vacuum

Max-Phases Investigated by Soft X-Ray Emission Spectroscopy

Contact Info

Product

Resources

About

Beamline I511 at MAX II, capabilities and performance

Cited by 146 publications

References 9 publications

Low Band Gap and Ionic Bonding with Charge Transfer Threshold in the Polymeric Lithium Fulleride Li4C60

Low Band Gap and Ionic Bonding with Charge Transfer Threshold in the Polymeric Lithium Fulleride Li4C60

Soft X‐ray induced oxidation on acrylic acid grafted luminescent silicon quantum dots in ultrahigh vacuum

Max-Phases Investigated by Soft X-Ray Emission Spectroscopy

Contact Info

Product

Resources

About

Low Band Gap and Ionic Bonding with Charge Transfer Threshold in the Polymeric Lithium Fulleride Li₄C₆₀

Low Band Gap and Ionic Bonding with Charge Transfer Threshold in the Polymeric Lithium Fulleride Li₄C₆₀