1997
DOI: 10.1016/s0168-583x(96)01016-6
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Beam-bunching in an ECR ion source by the pulsed gating-potential method

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“…1993). A similar gating technique has also been developed for an ECR ion source, giving a duty cycle of 52% at a repetition rate of 1 kHz (Jeong et al . 1997).…”
Section: (D ) Ion-beam Storage and Bunchingmentioning
confidence: 99%
“…1993). A similar gating technique has also been developed for an ECR ion source, giving a duty cycle of 52% at a repetition rate of 1 kHz (Jeong et al . 1997).…”
Section: (D ) Ion-beam Storage and Bunchingmentioning
confidence: 99%