2013
DOI: 10.1177/1748006x13492955
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Bayes linear variance structure learning for inspection of large scale physical systems

Abstract: Modelling of inspection data for large scale physical systems is critical to assessment of their integrity. We present a general method for inference about system state and associated model variance structure from spatially distributed time series which are typically short, irregular, incomplete and not directly observable. Bayes linear analysis simplifies parameter estimation and avoids often-unrealistic distributional assumptions. Second-order exchangeability judgements facilitate variance learning for spars… Show more

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Cited by 2 publications
(2 citation statements)
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“…This method is applied in an opinion pooling framework by Wisse et al, 8 while Quigley et al 9 demonstrate how the Bayes linear method can be used to estimate correlation in a setting with an underlying Poisson process. Randell et al 10 discuss application of this method to the inspection of large-scale physical systems. However, it is commonly regarded that specification of a full probability distribution over uncertain events is possible, as discussed, for instance, in French.…”
Section: Introductionmentioning
confidence: 99%
“…This method is applied in an opinion pooling framework by Wisse et al, 8 while Quigley et al 9 demonstrate how the Bayes linear method can be used to estimate correlation in a setting with an underlying Poisson process. Randell et al 10 discuss application of this method to the inspection of large-scale physical systems. However, it is commonly regarded that specification of a full probability distribution over uncertain events is possible, as discussed, for instance, in French.…”
Section: Introductionmentioning
confidence: 99%
“…As electronic systems are large and complex, anomalies and faults are governed by different failure mechanisms. 3 Because of the dynamic behavior, the multiple functions, the complex structures, and the numerous non-line and uncertain parameters, 4 an entire fault diagnostic analysis with direct inference can lead to a large inefficient knowledge base and poor diagnostic quality. 5 Therefore, it is often difficult and inefficient to perform detailed fault diagnostics directly on complete complex electronic systems.…”
Section: Introductionmentioning
confidence: 99%