2007
DOI: 10.1143/jjap.46.l359
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Barrier Modification at Contacts between Carbon Nanotube and Pt Electrode Using Well-Controlled Joule Heating

Abstract: We have studied the resistance of a metal and carbon nanotube contact formed in a scanning electron microscope. This contact often has high resistive polymer-like amorphous carbon that is formed by electron beam-induced deposition from residual gas molecules. Results of this study revealed that the contact resistance comprises a tunneling resistance and an ohmic resistance. The current-induced Joule heating reduces the barrier for the tunneling resistance at a low current level and then the ohmic resistance at… Show more

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Cited by 8 publications
(14 citation statements)
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“…Previous studies in metal-carbon nanotube contacts fabricated by EBID presented similar features, which were associated to a combination of tunneling and ohmic resistances. 19 However, as in the case for nanotubes, further studies are required to identify the precise nature of our FM/aC/graphene contacts.…”
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confidence: 99%
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“…Previous studies in metal-carbon nanotube contacts fabricated by EBID presented similar features, which were associated to a combination of tunneling and ohmic resistances. 19 However, as in the case for nanotubes, further studies are required to identify the precise nature of our FM/aC/graphene contacts.…”
mentioning
confidence: 99%
“…The transport properties of metal/aC/graphene interfaces have not been studied, much less its spin transfer properties. However, previous demonstrations 19 of improved metal-nanotube contacts using electron-beam induced deposition (EBID) of aC and the fact that carbon is a light material, which may introduce relatively low spin dephasing, make aC an excellent candidate for spintronic applications. Indeed, we demonstrate a 2 10 4 -fold enhancement of the spin signal in graphene lateral spin valves following EBID of aC interfacial layers.…”
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confidence: 99%
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“…Thus, according to the current change in the breakdown of the bifurcated MWCNT bundle in the Figure 3 , the Figure 4 shows the resistance circuit model without considering the capacitance and inductance [ 15 , 30 , 46 ]. Additionally, each carbon shell can be regarded as a single resistance.…”
Section: Resultsmentioning
confidence: 99%
“…During deposition, a dc voltage was applied between these two stages to improve the electrical contact between the CNT and the AFM probe tip. 23,24) Then a resistor of 500 k was inserted in the circuit to regulate the electrical current. After deposition, the dc voltage and the resistor were toggled to an exponential decay pulse generator.…”
Section: Fabrication Of Cnt Tipsmentioning
confidence: 99%