2008
DOI: 10.1063/1.2995862
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Bandgap engineering of tunnel oxide with multistacked layers of Al2O3/HfO2/SiO2 for Au-nanocrystal memory application

Abstract: Charge storage characteristics of metal-oxide-semiconductor (MOS) structure containing Au nanocrystals on tunnel oxide composed of triply stacked SiO2, HfO2, and Al2O3 layers were studied. Significantly high charge injection and detrapping efficiency for program and erase operations along with a satisfactory long-term charge retention were obtained from the above MOS structure. It is attributed to the bandgap engineering of tunnel oxide with a multistacked concave barrier, from which the effective thickness of… Show more

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Cited by 36 publications
(21 citation statements)
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“…[3][4][5][6][7][8][9] However, achieving large-area ordering of AuNPs as required in these applications has proven to be challenging. [10][11][12][13] Methods in synthesis and self-assembly appear to play important roles in the quality of the self-assembled monolayers.…”
Section: ' Introductionmentioning
confidence: 99%
“…[3][4][5][6][7][8][9] However, achieving large-area ordering of AuNPs as required in these applications has proven to be challenging. [10][11][12][13] Methods in synthesis and self-assembly appear to play important roles in the quality of the self-assembled monolayers.…”
Section: ' Introductionmentioning
confidence: 99%
“…In this report, gold nanoparticles synthesized by the pulsed laser deposition were used and gold nanoparticles were formed in-situ by the substrate annealing during growth (at 300°C and 550°C). Band engineered tunnelling oxide layer (composed of Al 2 O 3 /HfO 2 /SiO 2 ) have been used in gold nanoparticle-based memory devices [44]. Dielectric materials with different bandgaps were deposited in stacks as the tunnelling oxide layer, resulting in increased charge injection efficiencies as well as improved data retention properties.…”
Section: Operations Of Non-volatile Memory Devicesmentioning
confidence: 99%
“…A band engineered tunneling oxide layer (composed of Al 2 O 3 /HfO 2 / SiO 2 ) was used in gold nanoparticle-based memory devices. [26] Dielectric materials with different bandgaps were deposited in stacks as the tunneling oxide layer. The band engineered tunneling dielectric layer increased the charge injection efficiency and improved the data retention properties.…”
Section: Silicon-based Nfgm Devicesmentioning
confidence: 99%