To investigate both the optical and electrical properties of InN, we have measured the infrared reflectance spectra of InN thin
films and performed the fitting analyses of the infrared spectra to obtain not only phonon frequencies and the damping factors
but also the carrier concentration of InN. In this paper, we extend the aim of those analyses to the electron mobility and
demonstrate that the temperature dependence of the electron mobility can be discussed using the infrared reflectance spectra
analyses