2014
DOI: 10.1063/1.4901040
|View full text |Cite
|
Sign up to set email alerts
|

Band-offset non-commutativity of GaAs/AlGaAs interfaces probed by internal photoemission spectroscopy

Abstract: The GaAs/AlGaAs material system is believed to have a band offset without remarkable influence from the interface. We report here probing a slightly higher (5-10 meV) valence-band offset at the GaAs-on-Al 0.57 Ga 0.43 As interface compared to that of the Al 0.57 Ga 0.43 As-on-GaAs interface, by using internal photoemission spectroscopy. This indicates the non-commutativity of band offset for GaAs/AlGaAs, i.e., the dependence on the order of the growth of the layers. This result is consistently confirmed by obs… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
2
0

Year Published

2016
2016
2023
2023

Publication Types

Select...
5
1

Relationship

2
4

Authors

Journals

citations
Cited by 6 publications
(2 citation statements)
references
References 18 publications
0
2
0
Order By: Relevance
“…5, the response of LH1002 is nearly the same for negative and positive biases. A prior investigation [10] of the band offset shows that the response threshold energies are consistent with the designed structural parameters. No response threshold extension is observed for sample LH1002.…”
mentioning
confidence: 96%
“…5, the response of LH1002 is nearly the same for negative and positive biases. A prior investigation [10] of the band offset shows that the response threshold energies are consistent with the designed structural parameters. No response threshold extension is observed for sample LH1002.…”
mentioning
confidence: 96%
“…GaAs/AlGaAs heterojunctions [3,13,16,17], PtSi-Si diode [18], Si/HfO2 interfaces [19], and a grapheneinsulator-semiconductor structures [10,11].…”
Section: Introductionmentioning
confidence: 99%