2020
DOI: 10.1016/j.tsf.2020.138382
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Band gap tuning of p-type al-doped tio2 thin films for gas sensing applications

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Cited by 21 publications
(7 citation statements)
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“…Assuming the rutile phase, the peak observed at 140 cm –1 is the B 1g peak, while the other three peaks (240, 340, and 432 cm –1 ) are observed in lithiated TiO 2 (Li x TiO 2 , 0.3 < x < 0.5) (or lithium titanate) and are related to the vibrations of TiO 6 , LiO 6 , and LiO 4 (F 2g , F 2g , E g ), respectively. , The Al 0 Raman spectrum reveals that Li is doped in the TiO 2 layer and has a weak crystalline or weak ordered structure. These soft peaks were not observed in Al-doped thin films, which is interpreted as a result of Al doping increasing the structural disorder Figure S3c shows the fast-Fourier-transform (FFT) pattern and high-resolution transmission electron microscopy (HRTEM) image of the TiO 2 layer (the center of the film) of the Al 0 sample, where a rutile phase was observed.…”
Section: Resultsmentioning
confidence: 97%
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“…Assuming the rutile phase, the peak observed at 140 cm –1 is the B 1g peak, while the other three peaks (240, 340, and 432 cm –1 ) are observed in lithiated TiO 2 (Li x TiO 2 , 0.3 < x < 0.5) (or lithium titanate) and are related to the vibrations of TiO 6 , LiO 6 , and LiO 4 (F 2g , F 2g , E g ), respectively. , The Al 0 Raman spectrum reveals that Li is doped in the TiO 2 layer and has a weak crystalline or weak ordered structure. These soft peaks were not observed in Al-doped thin films, which is interpreted as a result of Al doping increasing the structural disorder Figure S3c shows the fast-Fourier-transform (FFT) pattern and high-resolution transmission electron microscopy (HRTEM) image of the TiO 2 layer (the center of the film) of the Al 0 sample, where a rutile phase was observed.…”
Section: Resultsmentioning
confidence: 97%
“…These soft peaks were not observed in Al-doped thin films, which is interpreted as a result of Al doping increasing the structural disorder. 53 Figure S3c shows the fast-Fourier-transform (FFT) pattern and high-resolution transmission electron microscopy (HRTEM) image of the TiO 2 layer (the center of the film) of the Al 0 sample, where a rutile phase was observed. In Al 3, Al 6, and Al 9 films, the same low crystallinity rutile phase was observed as in Al 0, but the change in crystallinity with Al doping was difficult to determine from the FFT pattern.…”
Section: ••mentioning
confidence: 99%
“…The difference in ionic radii of host W and dopant Gd elements is responsible for the shift and broadening of XRD peaks in spectra. The average crystallite size was estimated using the well known Debye-Scherrer formula [30] D , k cos = l b q Where k is the shape factor constant, λ is the wavelength of x-rays, β is the full width at half maximum, and θ is the angle of diffraction. The dislocation density ( ), d and micro-strain (e) in thin films can be calculated using the relations [30] and…”
Section: Structural Studiesmentioning
confidence: 99%
“…The doped system was characterized using XRD, Discrete fourier transform (DFT) analysis, Atomic force microscopy (AFM), Field Emission Scanning Electron Microscope (FESEM), and UV‐vis‐NIR spectroscopy. They reported that Al‐doping in TiO 2 thin films reduced indirect electrical bandgap [100] . Cr‐doped TiO 2 is used as a high‐temperature NO 2 gas sensor.…”
Section: Applicationsmentioning
confidence: 99%